Skills:
Materials Analysis and Characterization; SEM/EDS, single crystal and powder X-ray diffraction, UV-VIS spectrophotometry, FTIR, AFM, Dektak surface profilometery, Nomarski microscopy, spectroscopic ellipsometry, four-point probe, current-voltage measurements, capacitance-voltage measurements, laser scribing, EBIC, Sinton lifetime and Suns-Voc measurements, transfer length method, van der Pauw resistivity measurements, Nanomaterials; Dispersion, spray deposition, carbon nanotubes, gold nanoparticles on III-V substrates, Computer Skills; Microsoft Office, Igor Pro graphing software, CFD-ACE+ and CFD-GEOM, WVASE and CompleteEASE, LabVIEW, Management; MBA classes including Entrepreneurship, Supply Chain Management, and Systems Analysis and Design