Robert J Larsen

US Patent:

48781797, Oct 31, 1989

Filed:

Nov 12, 1987

Appl. No.:

7/119741

Inventors:

Robert P. Larsen - Fullerton CA
Steven T. Hoelke - Claremont CA
James A. Luisi - Anaheim CA

Assignee:

Rockwell International Corporation - El Segundo CA

International Classification:

G01R 3128
G06F 1100

US Classification:

364490

Abstract:

An interactive diagnostic methodology and apparatus that enables a specimen (microelectronic device) to undergo detailed behavioral examination while allowing the Diagnostician to incrementally proceed from a set of symptoms to a formal diagnosis. Diagnostic tactics are predicated on comparing measured behavior to predicted behavior. The methodology allows coupling to a variety of behavior-level, switch-level (state), and circuit-level (node) simulators in determining predicted behavior. The architecture allows a variety of beam-probing apparatus to be supported in acquiring nodal waveforms and logic state images from a specimen as a means of determining measured behavior. This measured behavior can be graphically compared to the predicted behavior for study and analysis by the Diagnostician to aid in the formulation of diagnostic tactics. The ability to easily couple a wide variety of simulation techniques and beam probing apparatus is achieved by viewing simulation and measurement as generic functions, which can be executed concurrently, from an architectural standpoint. To accelerate nodal navigation and model extraction, an object clustering data structure is used that exploits apriori continuity relationships between objects, symbolically representing the specimen's design.