Robert A Lyons

US Patent:

7161351, Jan 9, 2007

Filed:

Sep 3, 2004

Appl. No.:

10/934103

Inventors:

Neil J. Goldfine - Newton MA, US
Vladimir A. Zilberstein - Chestnut Hill MA, US
Darrell E. Schlicker - Watertown MA, US
David C. Grundy - Reading MA, US
Ian C. Shay - Waltham MA, US
Robert J. Lyons - Boston MA, US
Andrew P. Washabaugh - Chula Vista CA, US

Assignee:

Jentek Sensors, Inc. - Waltham MA

International Classification:

G01R 33/12

US Classification:

324242, 324240, 324226, 228102

Abstract:

Quasistatic sensor responses may be converted into multiple model parameters to characterize hidden properties of a material. Methods of conversion use databases of responses and, in some cases, databases that include derivatives of the responses, to estimate at least three unknown model parameters, such as the electrical conductivity, magnetic permeability, dielectric permittivity, thermal conductivity, and/or layer thickness. These parameter responses are then used to obtain a quantitative estimate of a property of a hidden feature, such as corrosion loss layer thicknesses, inclusion size and depth, or stress variation. The sensors can be single element sensors or sensor arrays and impose an interrogation electric, magnetic, or thermal field.

US Patent:

7188532, Mar 13, 2007

Filed:

Sep 8, 2004

Appl. No.:

10/937105

Inventors:

Neil J. Goldfine - Newton MA, US
Vladimir A. Zilberstein - Chestnut Hill MA, US
David C. Grundy - Reading MA, US
Andrew P. Washabaugh - Chula Vista CA, US
Darrell E. Schlicker - Watertown MA, US
Ian C. Shay - Waltham MA, US
Robert J. Lyons - Boston MA, US
Christopher A. Craven - Bedford MA, US
Christopher Root - Boulder CO, US
Mark D. Windoloski - Burlington MA, US
Volker Weiss - Syracuse NY, US

Assignee:

Jentek Sensors, Inc. - Waltham MA

International Classification:

G01B 7/16

US Classification:

73779

Abstract:

Observability of damage precursor, damage and usage states, or event occurrence may be enhanced by modifying component materials to include self-monitoring materials or by processing test material to alter the surface properties. The properties of the self monitoring materials, such as magnetic permeability or electrical conductivity, are monitored with electromagnetic sensors and provide greater property variations with component condition than the original component material. Processing includes shot peening or laser welding.

US Patent:

7451657, Nov 18, 2008

Filed:

Jan 14, 2005

Appl. No.:

11/036780

Inventors:

Neil J. Goldfine - Newton MA, US
Darrell E. Schlicker - Watertown MA, US
Vladimir A. Zilberstein - Chestnut Hill MA, US
Andrew P. Washabaugh - Chula Vista CA, US
Volker Weiss - Syracuse NY, US
Christopher A. Craven - Bedford MA, US
Ian C. Shay - Waltham MA, US
David C. Grundy - Reading MA, US
Karen E. Walrath - Arlington MA, US
Robert J. Lyons - Boston MA, US

Assignee:

JENTEK Sensors, Inc. - Waltham MA

International Classification:

G01B 5/30

US Classification:

73760, 324228

Abstract:

Methods are described for assessing material condition. These methods include the use of multiple source fields for interrogating and loading of a multicomponent test material. Source fields include electric, magnetic, thermal, and acoustic fields. The loading field preferentially changes the material properties of a component of the test material, which allows the properties of the component materials to be separated. Methods are also described for monitoring changes in material state using separate drive and sense electrodes with some of the electrodes positioned on a hidden or even embedded material surface. Statistical characterization of the material condition is performed with sensor arrays that provide multiple responses for the material condition during loading. The responses can be combined into a statistical population that permits tracking with respect to loading history. Methods are also described for measuring the stress in the material by independently estimating effective electrical properties, such as magnetic permeability or electrical conductivity, using layered models or predetermined spatial distributions with depth that are then correlated with the stress.

US Patent:

7526964, May 5, 2009

Filed:

Jan 24, 2003

Appl. No.:

10/351978

Inventors:

Neil J. Goldfine - Newton MA, US
Vladimir A. Zilberstein - Chestnut Hill MA, US
James M. Fisher - Centerville GA, US
David C. Grundy - Reading MA, US
Darrell E. Schlicker - Watertown MA, US
Vladimir Tsukernik - West Roxbury MA, US
Robert J. Lyons - Boston MA, US
Ian C. Shay - Cambridge MA, US
Andrew P. Washabaugh - Chula Vista CA, US

Assignee:

JENTEK Sensors, Inc. - Waltham MA

International Classification:

G01N 3/32

US Classification:

73779

Abstract:

Methods are described for the use of conformable eddy-current sensors and sensor arrays for characterizing residual stresses and applied loads in materials. In addition, for magnetizable materials such as steels, these methods can be used to determine carbide content and to inspect for grinding burn damage. The sensor arrays can be mounted inside or scanned across the inner surface of test articles and hollow fasteners to monitor stress distributions. A technique for placing eddy-current coils around magnetizable fasteners for load distribution monitoring is also disclosed.

US Patent:

7696748, Apr 13, 2010

Filed:

Oct 12, 2004

Appl. No.:

10/963482

Inventors:

Darrell E. Schlicker - Watertown MA, US
Neil J. Goldfine - Newton MA, US
David C. Grundy - Reading MA, US
Robert J. Lyons - Boston MA, US
Vladimir A. Zilberstein - Chestnut Hill MA, US
Andrew P. Washabaugh - Chula Vista CA, US
Vladimir Tsukernik - West Roxbury MA, US
Mark D. Windoloski - Burlington MA, US
Ian C. Shay - Waltham MA, US

Assignee:

Jentek Sensors, Inc. - Waltham MA

International Classification:

G01N 27/82
G01R 33/12
G01B 7/24

US Classification:

324240, 324262, 324202

Abstract:

Methods and apparatus are described for absolute electrical property measurement of materials. This is accomplished with magnetic and electric field based sensors and sensor array geometries that can be modeled accurately and with impedance instrumentation that permits accurate measurements of the in-phase and quadrature phase signal components. A dithering calibration method is also described which allows the measurement to account for background material noise variations. Methods are also described for accounting for noise factors in sensor design and selection of the optimal operating conditions which can minimize the error bounds for material property estimates. Example application of these methods to automated engine disk slot inspection and assessment of the mechanical condition of dielectric materials are presented.

US Patent:

7812601, Oct 12, 2010

Filed:

Jun 15, 2009

Appl. No.:

12/484761

Inventors:

Neil J. Goldfine - Newton MA, US
Andrew P. Washabaugh - Chula Vista CA, US
Yanko K. Sheiretov - Waltham MA, US
Darrell E. Schlicker - Watertown MA, US
Robert J. Lyons - Boston MA, US
Mark D. Windoloski - Chelmsford MA, US
Christopher A. Craven - Bedford MA, US
Vladimir B. Tsukernik - West Roxbury MA, US
David C. Grundy - Reading MA, US

Assignee:

JENTEK Sensors, Inc. - Waltham MA

International Classification:

G01N 27/72
G01N 27/90

US Classification:

324238, 324235, 324209

Abstract:

Eddy current sensors and sensor arrays are used for process quality and material condition assessment of conducting materials. In an embodiment, changes in spatially registered high resolution images taken before and after cold work processing reflect the quality of the process, such as intensity and coverage. These images also permit the suppression or removal of local outlier variations. Anisotropy in a material property, such as magnetic permeability or electrical conductivity, can be intentionally introduced and used to assess material condition resulting from an operation, such as a cold work or heat treatment. The anisotropy is determined by sensors that provide directional property measurements. The sensor directionality arises from constructs that use a linear conducting drive segment to impose the magnetic field in a test material. Maintaining the orientation of this drive segment, and associated sense elements, relative to a material edge provides enhanced sensitivity for crack detection at edges.

US Patent:

7876094, Jan 25, 2011

Filed:

Apr 4, 2008

Appl. No.:

12/080743

Inventors:

Neil J. Goldfine - Newton MA, US
Ian C. Shay - Cambridge MA, US
Darrell E. Schlicker - Watertown MA, US
Andrew P. Washabaugh - Chula Vista CA, US
David C. Grundy - Reading MA, US
Robert J. Lyons - Boston MA, US
Vladimir A. Zilberstein - Chestnut Hill MA, US
Vladimir Tsukernik - West Roxbury MA, US

Assignee:

JENTEK Sensors, Inc. - Waltham MA

International Classification:

G01N 27/72
G01N 27/82
G01N 33/12

US Classification:

324209, 324242, 324243, 324239

Abstract:

Described are methods for monitoring of stresses and other material properties. These methods use measurements of effective electrical properties, such as magnetic permeability and electrical conductivity, to infer the state of the test material, such as the stress, temperature, or overload condition. The sensors, which can be single element sensors or sensor arrays, can be used to periodically inspect selected locations, mounted to the test material, or scanned over the test material to generate two-dimensional images of the material properties. Magnetic field or eddy current based inductive and giant magnetoresistive sensors may be used on magnetizable and/or conducting materials, while capacitive sensors can be used for dielectric materials. Methods are also described for the use of state-sensitive layers to determine the state of materials of interest. These methods allow the weight of articles, such as aircraft, to be determined.

US Patent:

8237433, Aug 7, 2012

Filed:

Jan 19, 2011

Appl. No.:

13/009370

Inventors:

Neil J. Goldfine - Newton MA, US
Ian C. Shay - Cambridge MA, US
Darrell E. Schlicker - Watertown MA, US
Andrew P. Washabaugh - Chula Vista CA, US
David C. Grundy - Reading MA, US
Robert J. Lyons - Boston MA, US
Vladimir A. Zilberstein - Chestnut Hill MA, US

Assignee:

Jentek Sensors, Inc. - Waltham MA

International Classification:

G01N 27/72
G01N 27/90

US Classification:

324238, 324209, 324235, 324240, 324262

Abstract:

Described are methods for monitoring of stresses and other material properties. These methods use measurements of effective electrical properties, such as magnetic permeability and electrical conductivity, to infer the state of the test material, such as the stress, temperature, or overload condition. The sensors, which can be single element sensors or sensor arrays, can be used to periodically inspect selected locations, mounted to the test material, or scanned over the test material to generate two-dimensional images of the material properties. Magnetic field or eddy current based inductive and giant magnetoresistive sensors may be used on magnetizable and/or conducting materials, while capacitive sensors can be used for dielectric materials. Methods are also described for the use of state-sensitive layers to determine the state of materials of interest. These methods allow the weight of articles, such as aircraft, to be determined.

Address:

467 S Main St, Suffield, CT 06078

Phone:

8606682598

VIN:

3VWDJ71K08M098363

Make:

VOLKSWAGEN

Model:

GLI

Year:

2008