Robert C Mcleod

US Patent:

7212723, May 1, 2007

Filed:

Feb 16, 2006

Appl. No.:

11/357737

Inventors:

Robert R. McLeod - Boulder CO, US
Eric D. Moore - Boulder CO, US

Assignee:

The Regents of the University of Colorado - Boulder CO

International Classification:

G02B 6/00

US Classification:

385147, 264401, 264405, 264477, 264494, 264 124, 264 127

Abstract:

A waveguide array is fabricated by providing a photoreactive material and generating an optical intensity pattern corresponding to a geometry of the waveguide array. A relative translation of the photoreactive material is effected through the optical intensity pattern. Thereafter, the photoreactive material is rendered substantially unreactive to light at at least a wavelength of the optical intensity pattern.

US Patent:

7292516, Nov 6, 2007

Filed:

Dec 30, 2004

Appl. No.:

11/027536

Inventors:

Paulo E. Xavier da Silveira - Boulder CO, US
Robert R. McLeod - Boulder CO, US

Assignee:

Storage Technology Corporation - Louisville CO

International Classification:

G11B 7/00

US Classification:

369103, 369 4414, 369 4418, 369 4441, 36911201

Abstract:

A system for phase detection in page-based optical data storage involves a number of features that may be used individually or in combination to provide optimizations and to facilitate the heterodyne detection of the modulated readout signal beam. In one aspect, alignment sensors provide signals indicative of angular misalignment between the heterodyne reference beam and the signal beam, and a feedback control system aligns the reference beam with respect to the signal beam. In another aspect, a differential detection approach is utilized. In yet another aspect, a scanning approach is used wherein the reference beam is scanned over approximately a wavelength of phase difference to cause interference fringes to shift over the photodetector pixel array. Each pixel detects the signal at the phase value that cancels out localized variations of the wavefront, thus increasing the tolerance of the system to phase errors and to angular misalignments.

US Patent:

8392138, Mar 5, 2013

Filed:

Aug 6, 2009

Appl. No.:

12/537003

Inventors:

Eric D. Moore - Boulder CO, US
Robert R. McLeod - Boulder CO, US

Assignee:

The Regents of the University of Colorado - Denver CO

International Classification:

G01B 9/02
G06F 19/00

US Classification:

702 89, 73 101, 738658, 2502521, 356450, 702 90, 702107, 702176, 702189

Abstract:

The frequency-sampling method is widely used to accommodate nonlinear electromagnetic source tuning in swept-wavelength interferometric techniques, such as optical frequency domain reflectometry (OFDR) and swept-wavelength optical coherence tomography (OCT). Two sources of sampling errors are associated with the frequency-sampling method. One source of error is the limit of an underlying approximation for long interferometer path mismatches and fast electromagnetic source tuning rates. A second source of error is transmission delays in data acquisition hardware. Aspects of the invention relate to a method and system for correcting sampling errors in swept-wavelength interferometry systems such that the two error sources correct sampling errors associated with the first radiation path and the second radiation path cancel to second order.

US Patent:

8597871, Dec 3, 2013

Filed:

Jun 16, 2006

Appl. No.:

11/993015

Inventors:

Robert R. McLeod - Boulder CO, US

Assignee:

The Regents of the University of Colorado - Denver CO

International Classification:

G03F 7/20
G02B 6/12
G02B 21/18

US Classification:

430321, 430320, 385 14, 385 51, 385146

Abstract:

A method of creating a region of index change in a photopolymer includes providing a photopolymer having a photosensitivity to light of a particular wavelength and creating a region of index change in the photopolymer by applying direct write lithography to expose the photopolymer of the region to light that includes the particular wavelength.

US Patent:

20050248817, Nov 10, 2005

Filed:

May 7, 2004

Appl. No.:

10/840293

Inventors:

Samuel Weaver - Boulder CO, US
Robert McLeod - Boulder CO, US
Kevin Curtis - Longmont CO, US
Adrian Hill - Lyons CO, US

Assignee:

InPhase Technologies, Inc. - Longmont CO

International Classification:

G03H001/04

US Classification:

359002000, 430001000, 430002000, 283086000

Abstract:

Disclosed is an article having a holographic recording medium having digital data that cannot be seen by human eye, wherein the holographic recording medium is a holographic material that records volume holograms that permit authentication of the article and the holographic material is attached to or part of the article. Also disclosed is a method of authentication of the article.

US Patent:

20060082850, Apr 20, 2006

Filed:

Oct 18, 2004

Appl. No.:

10/965867

Inventors:

Samuel Weaver - Boulder CO, US
Robert McLeod - Boulder CO, US
Kevin Curtis - Longmont CO, US
Adrian Hill - Lyons CO, US

International Classification:

G03H 1/00

US Classification:

359002000, 283086000

Abstract:

Disclosed is an article having a surface-relief holographic recording medium having digital data that cannot be seen by human eye. Also disclosed is a tilted-plane optical reader system which can be used to read the stored data in the hologram.

US Patent:

20120092632, Apr 19, 2012

Filed:

Apr 1, 2011

Appl. No.:

13/078485

Inventors:

Robert R. McLeod - Boulder CO, US
Christopher N. Bowman - Boulder CO, US
Timothy F. Scott - Boulder CO, US
Amy C. Sullivan - Decatur GA, US

Assignee:

The Regents of the University of Colorado, a body corporate - Denver CO

International Classification:

G03B 27/42
C08K 5/18
G03F 7/075
G03F 7/031
G03F 7/20
G03F 7/004

US Classification:

355 53, 430325, 4302701, 4302851, 4302811, 522 28

Abstract:

Methods, devices, systems, and materials are disclosed for diffraction unlimited photofabrication. A method is provided where a photoresponsive material is illuminated with a first optical pattern at a first wavelength of light. The first wavelength of light alters a solubility of the photoresponsive organic material. The photoresponsive material is also illuminated with a second optical pattern at a second wavelength of light. The second wavelength of light hinders the ability of the first wavelength of light to alter the solubility of the photoresponsive organic material where the second optical pattern overlaps the first optical pattern. The photoresponsive organic material is then developed.

US Patent:

20120194823, Aug 2, 2012

Filed:

Jan 30, 2012

Appl. No.:

13/361888

Inventors:

Eric Moore - Boulder CO, US
Robert McLeod - Boulder CO, US

Assignee:

The Regents of the University of Colorado, a body corporate - Denver CO

International Classification:

G01B 9/02
G01S 13/86
G01B 11/02

US Classification:

356479, 356498, 356511, 356450, 342 54

Abstract:

Interferometric path length measurements using frequency-domain interferometry form the basis of several measurement techniques, including optical frequency domain reflectometry (OFDR), optical coherence tomography (OCT), and frequency-modulated continuous wave (FMCW) radar and lidar. A phase-sensitive and self-referenced approach to frequency-domain interferometry yields absolute and relative path length measurements with axial precision orders of magnitude better than the transform-limited axial resolution of the system.