Robert M Nesbitt

US Patent:

D3457052, Apr 5, 1994

Filed:

Mar 9, 1992

Appl. No.:

7/849316

Inventors:

Robert J. Nesbitt - North Attleboro MA
Bruce A. Seavey - North Attleboro MA

Assignee:

TTI TesTron, Inc. - Woonsocket RI

US Classification:

D10 80

US Patent:

52006948, Apr 6, 1993

Filed:

May 18, 1992

Appl. No.:

7/884909

Inventors:

Robert J. Nesbitt - North Attleboro MA
Bruce A. Seavey - North Attleboro MA

Assignee:

TTI TesTron, Inc. - Woonsocket RI

International Classification:

G01R 102
G01R 104

US Classification:

324158F

Abstract:

A head assembly for a vacuum actuated printed circuit board test fixture includes a top plate adapted for receiving a printed circuit board thereon, a probe plate having a plurality of spring-loaded contact probes thereon, and a support assembly for supporting the top plate in sealed relation above the probe plate. The support assembly includes a primary seal member having a channel formed therein and a resilient secondary seal member in the channel which cooperates with the primary seal member to provide a seal between the top plate and the probe plate around the entire perimeter of the top plate and to support the top plate so that it is movable toward the probe plate by resiliently compressing the secondary seal member.

US Patent:

47468610, May 24, 1988

Filed:

Aug 21, 1986

Appl. No.:

6/899736

Inventors:

Robert J. Nesbitt - North Attleboro MA

Assignee:

TTI Testron, Inc. - Cumberland RI

International Classification:

G01R 3102

US Classification:

324158F

Abstract:

A test fixture for testing a printed circuit board assembly on a computerized test system includes a vacuum-actuated base which is receivable and securable in electrically connected relation on the test system and a vacuum-actuated test head which is releasably receivable on the base and adapted for receiving a printed circuit board assembly thereon to electrically interconnect the printed circuit board assembly to the test system through the base. The test head is readily interchangeable with other test heads to enable the fixture to be adapted for testing printed circuit board assemblies of different configurations on the test system without disconnecting the base from the test system.