Roderic Lee Osgood

US Patent:

46957944, Sep 22, 1987

Filed:

May 31, 1985

Appl. No.:

6/739832

Inventors:

Charley B. Bargett - Santa Barbara CA
Roderic L. Osgood - Goleta CA
Joseph L. Davis - Santa Barbara CA
Richard J. Joyce - Thousand Oaks CA

Assignee:

Santa Barbara Research Center - Goleta CA

International Classification:

G01R 3128

US Classification:

324158R

Abstract:

Method and apparatus for calibrating equipment used for testing photodiode arrays by reference to the diode under test. The diodes are illuminated with infrared radiation and different bias voltages, developed by bombardment with an electron beam, are measured at zero current. The measured voltage values are correlated with secondary emission sensor readouts to calibrate the sensor according to the specific diode being tested. Remote light emitting diodes generate the infrared radiation which is coupled to the photodiode array via optical fiber elements.

US Patent:

47301589, Mar 8, 1988

Filed:

Jun 6, 1986

Appl. No.:

6/871231

Inventors:

Ichiro Kasai - Santa Barbara CA
Roderic L. Osgood - Goleta CA
Charley B. Burgett - Santa Barbara CA
Richard J. Joyce - Thousand Oaks CA
Michael D. Warfield - Oxnard CA

Assignee:

Santa Barbara Research Center - Goleta CA

International Classification:

G01R 3126
G01R 3128

US Classification:

324158R

Abstract:

Method and apparatus for testing photodiode arrays using an electron beam. The diodes are charged at successive intervals over the RC time constant curve to develop successively increasing voltages at the ends of succeeding time intervals. Diode voltage and current are measured at the end of each interval and the resulting data are used to develop a current-voltage characteristic for each diode.