Roger E Perry

US Patent:

6373270, Apr 16, 2002

Filed:

Nov 10, 1999

Appl. No.:

09/439424

Inventors:

John Cochran - Fort Wayne IN
Roger L. Perry - Franksville WI

Assignee:

RPI, Inc. - Racine WI

International Classification:

G01R 3102

US Classification:

324760, 3241581, 324537, 324754, 165 61

Abstract:

Disclosed is an environmental test apparatus having a thermal chamber for stress testing electronic products. The apparatus has a carrier for supporting the products in the chamber and equipment for monitoring product characteristics during stress testing. The improved apparatus has an auxiliary chamber in which ambient temperature and humidity conditions prevail. A flexible partition is interposed between the thermal and auxiliary chambers, the monitoring equipment is in the auxiliary chamber and the carrier having products under test mounted thereon is in the thermal chamber. A conveying mechanism is in the auxiliary chamber and the support platform is in driven engagement with such mechanism, thereby causing movement of the platform along the auxiliary chamber.

US Patent:

59293403, Jul 27, 1999

Filed:

Jun 15, 1998

Appl. No.:

9/094708

Inventors:

John Cochran - Fort Wayne IN
Roger L. Perry - Franksville WI

Assignee:

RPI, Inc. - Racine WI

International Classification:

G01B 716

US Classification:

73766

Abstract:

An environmental test apparatus has a thermal chamber for stress testing electronic products and a wall separating the thermal chamber from ambient air around the apparatus. In the improvement, the wall comprises a pair of barrier walls having a flexible partition interposed between them. The barrier walls and the flexible partition substantially isolate the ambient air from the thermal chamber. The apparatus also includes a platform in the ambient air and a feedthrough card extending from the platform through the flexible partition into the thermal chamber. In one, more specific embodiment, the barrier walls are below the thermal chamber and the platform is below the barrier walls. In other embodiments, the barrier walls are lateral to the thermal chamber and the apparatus includes one or two racks, also lateral to such chamber. One or respective platforms are supported on the rack(s).

US Patent:

59429011, Aug 24, 1999

Filed:

Dec 30, 1997

Appl. No.:

9/001236

Inventors:

John Cochran - Fort Wayne IN
Mike Konruff - Burlington WI
Adam Peplinski - Big Bend WI
Roger L. Perry - Franksville WI

Assignee:

RPI, Inc. - Racine WI

International Classification:

H01H 1502
G01R 102

US Classification:

324555

Abstract:

The disclosure involves a transfer switch having a stationary frame and a front terminal matrix for connection to circuit boards undergoing test. There are two stationary connectors mounted on the switch frame. A platform is supported by the frame for reciprocating movement between first and second positions. Such platform has two movable connectors thereon and when the platform is in the first position, one of the movable connectors engages or "plug-connects" to one of the stationary connectors. When the platform is in the second position, the other movable connector plug connects to the other stationary connector. The stationary connectors are electrically coupled to respective test devices, e. g. , a load board and a signal bus. Thus, the boards under test can be connected to one or the other of the test devices by shifting the position of the platform.

US Patent:

57739838, Jun 30, 1998

Filed:

Jul 17, 1996

Appl. No.:

8/682148

Inventors:

John Cochran - Fort Wayne IN
Mike Konruff - Burlington WI
Adam Peplinski - Big Bend WI
Roger L. Perry - Franksville WI

Assignee:

RPI, Inc. - Racine WI

International Classification:

H01H 1502
G01R 102

US Classification:

324555

Abstract:

The disclosure involves a transfer switch having a stationary frame and a front terminal matrix for connection to circuit boards undergoing test. There are two stationary connectors mounted on the switch frame. A platform is supported by the frame for reciprocating movement between first and second positions. Such platform has two movable connectors thereon and when the platform is in the first position, one of the movable connectors engages or "plug-connects" to one of the stationary connectors. When the platform is in the second position, the other movable connector plug-connects to the other stationary connector. The stationary connectors are electrically coupled to respective test devices, e. g. , a load board and a signal bus. Thus, the boards under test can be connected to one or the other of the test devices by shifting the position of the platform.

US Patent:

62081306, Mar 27, 2001

Filed:

Nov 3, 1999

Appl. No.:

9/433154

Inventors:

John Cochran - Fort Wayne IN
Michael Konruff - Burlington WI
Adam Peplinski - Big Bend WI
Roger L. Perry - Franksville WI

Assignee:

RPI, Inc. - Racine WI

International Classification:

G01R31/02

US Classification:

3241581

Abstract:

The disclosure involves a transfer switch having a stationary frame and a front terminal matrix for connection to circuit boards undergoing test. There are two stationary connectors mounted on the switch frame. A platform is supported by the frame for reciprocating movement between first and second positions. Such platform has two movable connectors thereon and when the platform is in the first position, one of the movable connectors engages or "plug-connects" to one of the stationary connectors. When the platform is in the second position, the other movable connector plug-connects to the other stationary connector. The stationary connectors are electrically coupled to respective test devices, e. g. , a load board and a signal bus. Thus, the boards under test can be connected to one or the other of the test devices by shifting the position of the platform.

US Patent:

60054042, Dec 21, 1999

Filed:

Apr 30, 1997

Appl. No.:

8/841216

Inventors:

John Cochran - Fort Wayne IN
Roger L. Perry - Franksville WI

Assignee:

RPI, Inc. - Racine WI

International Classification:

G01R 3102

US Classification:

324760

Abstract:

Disclosed is an environmental test apparatus having a thermal chamber for stress testing electronic products. The apparatus has a carrier for supporting the products in the chamber and equipment for monitoring product characteristics during stress testing. The improved apparatus has an auxiliary chamber in which ambient temperature and humidity conditions prevail. A flexible partition is interposed between the thermal and auxiliary chambers, the monitoring equipment is in the auxiliary chamber and the carrier having products under test mounted thereon is in the thermal chamber. A conveying mechanism is in the auxiliary chamber and the support platform is in driven engagement with such mechanism, thereby causing movement of the platform along the auxiliary chamber.