Daniel D'Souza - Monte Sereno CA Ruth Alexander - Monte Sereno CA
International Classification:
G01R 3128
US Classification:
3241581
Abstract:
An integrated circuit (IC) test architecture and technique which can be used in conformity with the IEEE 1149. 1 test standard and configured on a single chip. This chip can be remotely controlled via a PC or workstation to generate stimulus and collect response data to fully test an IC which matches the foot print of the test chip. The specified technique uses the IEEE test standard with additional logic on a single chip which permits at speed test functional test of ICs. The test chip can be connected to a PC or workstation via the four (4) channel Test Access Port. By remotely controlling the test chip from the PC or Workstation, stimulus and response data can be generated to completely test any Integrated circuit having a foot print matching the IC of the test chip. In one embodiment, the test chip is mounted on a probe card for at speed functional test of wafers. In another embodiment, the test chip is placed in a socket or adapter for at speed package level test.
Daniel D'Souza - Monte Sereno CA Ruth Alexander - Monte Sereno CA
International Classification:
G01R 3128
US Classification:
324158R
Abstract:
An integrated circuit (IC) test architecture and technique which can be used in conformity with the IEEE 1149. 1 test standard and configured on a single chip. This chip can be remotely controlled via a PC or workstation to generate stimulus and collect response data to fully test an IC which matches the foot print of the test chip. The specified technique uses the IEEE test standard with additional logic on a single chip which permits at speed test functional test of ICs. The test chip can be connected to a PC or workstation via the four (4) channel Test Access Port. By remotely controlling the test chip from the PC or Workstation, stimulus and response data can be generated to completely test any Integrated circuit having a foot print matching the IC of the test chip. In one embodiment, the test chip is mounted on a probe card for at speed functional test of wafers. In another embodiment, the test chip is placed in a socket or adapter for at speed package level test.
Stage Four art exhibition used to rasie money for Victorian farmers.
Category:
Entertainment
Uploaded:
02 Jun, 2010
Duration:
1m 52s
Googleplus
Ruth Alexander
Tagline:
I'm a moron:')
Ruth Alexander
Tagline:
My name is Ruth Alexander, I am a 52 year old Early Years Teacher/Tutor from Scotland and am now looking to develop my career further as a Governess. I have been teaching for 32 years, 26 of those years have been overseas…Germany, Oman, South Korea and Egypt. I am very experienced and well-travelled, outgoing, positive, creative and fun. I love working with children and have been involved in not just teaching and tutoring them but also doing birthday parties and activity groups for them. I perceive myself as a cross between Nanny McPhee and Mary Poppins! Since working as a private tutor I have built up a very close working relationship with the children I work with and their parents. I have very high expectations of what a child can achieve. Learning should be fun, the children should be involved on every level and whenever possible different learning styles should be addressed. I think good manners and etiquette are also very important. “Children are the world`s most valuable resource and its best hope for the future” John F Kennedy