Samuel E Martin

US Patent:

6938224, Aug 30, 2005

Filed:

Feb 20, 2002

Appl. No.:

10/079447

Inventors:

Thaddeus John Gabara - Murray Hill NJ, US
Samuel Suresh Martin - Gillette NJ, US

Assignee:

Lucent Technologies Inc. - Murray Hill NJ

International Classification:

G06F017/50

US Classification:

716 1, 716 4, 716 7, 703 2, 703 14

Abstract:

A method of predicting the electromagnetic noise emitted by a digital circuit on an integrated circuit is disclosed. In accordance with the illustrative embodiment, the output of each digital circuit element in the digital circuit is considered as a bit stream. All of these bits streams are, in aggregate, considered as a noise source that is characterized by a power spectral density, S(ω). The effect of the noise source on an analog circuit can be modeled as a lumped circuit, wherein the lumped circuit contains a noise source that represents the digital circuit; a multi-port network, also referred to as a lumped element, that represents that portion of the substrate between the digital circuit and the analog circuit; and a multi-port network that represents the analog circuit.

US Patent:

56839170, Nov 4, 1997

Filed:

Jul 3, 1996

Appl. No.:

8/674956

Inventors:

Samuel Suresh Martin - Gillette NJ
Ralph Francis Trambarulo - Red Bank NJ
Cuong Tran - Howell NJ

Assignee:

Lucent Technologies - Murray Hill NJ

International Classification:

H01L 2166

US Classification:

437 8

Abstract:

The disclosed method of making a semiconductor device comprises a screening procedure that facilitates identification of devices having relatively low flicker noise. The devices are typically semiconductor diodes. The procedure utilizes our discovery of a correlation between the reverse bias current I. sub. r of a semiconductor device and the flicker noise power, and comprises measurement of the reverse bias current and comparison of the measured value with a predetermined comparison value I. sub. rc. Devices having I. sub. r. ltoreq. I. sub. rc are those that have relatively low flicker noise. The screening procedure is simple and quick, and can be readily performed in a manufacturing environment.

US Patent:

59704292, Oct 19, 1999

Filed:

Aug 8, 1997

Appl. No.:

8/907760

Inventors:

Samuel Suresh Martin - Gillette NJ

Assignee:

Lucent Technologies, Inc. - Murray Hill NJ

International Classification:

G01R 2926

US Classification:

702 65

Abstract:

A method and apparatus for measuring electrical noise in devices is disclosed that comprises two distinct measurement phases. In one phase, the differential output resistance, r. sub. ab, between a first terminal, a, and a second terminal, b, of the device under test is measured. In the second phase, a voltage, V. sub. L (t), is measured across a load resistance, R. sub. L, that is in series with the first terminal, a, of the device under test. Then the output voltage noise spectral density, S. sub. VL, is determined based on a fourier transform of the voltage, V. sub. L (t); and the output current noise spectral density, S. sub. ia, is determined based on the output voltage noise spectral density, S. sub. VL, the load resistance, R. sub. L, and the differential output resistance, r. sub. ab.