Sang Hun Kim

US Patent:

6399462, Jun 4, 2002

Filed:

Jun 30, 1997

Appl. No.:

08/885046

Inventors:

Krishnaswamy Ramkumar - San Jose CA
Sang S. Kim - Laguna Hills CA
Sharmin Sadoughi - Cupertino CA
Pamela Trammel - San Jose CA
Avner Shelem - San Jose CA

Assignee:

Cypress Semiconductor Corporation - San Jose CA

International Classification:

H01L 2176

US Classification:

438439, 438297, 438424, 438425

Abstract:

A method of forming a field oxide or isolation region in a semiconductor die. A nitride layer (over an oxide layer disposed over a substrate) is patterned and subsequently etched so that the nitride layer has a nearly vertical sidewall. The oxide layer and the substrate in the isolation region are etched to form a recess in the substrate having a sloped surface with respect to the nearly vertical sidewall of the nitride layer. A field oxide is then grown in the recess using a high pressure, dry oxidizing atmosphere. The sloped sidewall of the substrate effectively moves the face of the exposed substrate away from the edge of the nitride layer sidewall. Compared to non-sloped techniques, the oxidation appears to start with a built-in offset from the patterned etch. This leads to a reduction of oxide encroachment and a nearly non-existent birds beak. The desirable range of slopes for the substrate sidewall is approximately 50Â-80Â with respect to a nearly planar surface of the substrate in the recess.

US Patent:

6546412, Apr 8, 2003

Filed:

Nov 7, 1997

Appl. No.:

08/966381

Inventors:

Sang W. Kim - Lawndale CA
David P. Nesbitt - Redondo Beach CA
Steve A. Okamoto - Torrance CA
Jennifer D. Thomas - Hermosa Beach CA

Assignee:

Xerox Corporation - Stamford CT

International Classification:

G06F 900

US Classification:

709104, 709107

Abstract:

Temporary states are used transitionally in run-time situations and are unknown to the object database. A temporary state is created if, when an object is performing a requested event, interim work needs to be performed before the object reaches a permanent destination state. Use of a temporary state is transparent to the caller of the requested event. Within a single flow of control, an unlimited number of nested locks may be acquired. A request to unlock an object will only truly unlock the object if the unlock requester is at the highest level of locking. For recursive or embedded functions, no knowledge of the previous locking condition is necessary. Attribute-based locking provides a mechanism for allowing only certain members of the system to lock an object for writing while the object is in a predetermined state. However, any thread may obtain a read lock on an object in order to examine its attributes. This may be expanded to state that the system may restrict locking of an object or entity based upon any attribute in the database or upon any combination or logical expression of these attributes.

US Patent:

6971100, Nov 29, 2005

Filed:

Apr 5, 2002

Appl. No.:

10/115914

Inventors:

Sang W. Kim - Lawndale CA, US
David P. Nesbitt - Redondo Beach CA, US
Steve A. Okamoto - Torrance CA, US
Jennifer D. Thomas - Hermosa Beach CA, US

Assignee:

Xerox Corporation - Stamford CT

International Classification:

G06F009/46

US Classification:

718102

Abstract:

Temporary states are used transitionally in run-time situations and are unknown to the object database. A temporary state is created if, when an object is performing a requested event, interim work needs to be performed before the object reaches a permanent destination state. Use of a temporary state is transparent to the caller of the requested event.

US Patent:

20090070919, Mar 19, 2009

Filed:

Sep 19, 2007

Appl. No.:

11/858072

Inventors:

SANG HO KIM - Rancho Cucamonga CA, US

International Classification:

A41F 9/00

US Classification:

2319, 2338

Abstract:

The invention provides an all-in-one golf belt for attaching objects. In an embodiment, the all-in-all golf belt includes: a flat strip having inner and outer surfaces, which is configured to be disposed around a portion of a golfer's body; fasteners provided on the outer surface of the flat strip, one or more of the fasteners being configured to engage at least one of the objects; and holding portions provided in each of the objects, each of the holding portions being configured to hold a portion of at least one of the fasteners. The holding portions of the objects are configured to hold the at least one of the fasteners with force of a predetermined magnitude. The fasteners may include hook-and-loop fasteners and magnets. The objects may be a glove, a ball marker, a ball mark repair tool, and a golf ball pouch.

US Patent:

20090098513, Apr 16, 2009

Filed:

Oct 15, 2007

Appl. No.:

11/974482

Inventors:

Sang Ki Kim - Anaheim CA, US

International Classification:

A61C 5/09
A61C 5/10

US Classification:

4332221, 433223

Abstract:

A coping material for a prosthetic crown is provided. The coping material according to current application is comprised of two portions which are mechanically bonded each other. The first portion is the main coping portion that is located beneath of the enamel layer of a crown. The first portion is made from, including but not limited to, common metal and/or portion fused gold (PFG). The second is the portion which makes contact with gum tissue. That portion surrounds the brim of the bottom of the coping for 360 degrees. The gum contacting portion is comprised of bio-gold that is mechanically bonded to the main coping portion. Centrifuging of molten bio-gold technology is applied for mechanical bonding of the two portions. Electronic forming technology is also applied for mechanical bonding.

US Patent:

20090159763, Jun 25, 2009

Filed:

Dec 20, 2007

Appl. No.:

11/961979

Inventors:

Sang Kwon Kim - Culver City CA, US

International Classification:

F16M 11/00

US Classification:

248174, 2481761

Abstract:

A portable laptop stand comprising a generally rectangular flat board having a longitudinal axis perpendicular to a width of the board; said board having a distal end; said board having a proximal end; said board having a first portion, a second portion pivotably coupled to the first portion, and a main body pivotably coupled to the second portion; wherein the first portion has a longitudinal axis that is perpendicular to the longitudinal axis of the board; wherein the second portion has a longitudinal axis that is perpendicular to the longitudinal axis of the board; wherein said first portion is capable of folding back towards the main body and contact the main body. The board having a first attachment means disposed on the first portion; and a second attachment means disposed on the main body to detachably attach to said first attachment means.

US Patent:

48599387, Aug 22, 1989

Filed:

Jul 27, 1987

Appl. No.:

7/078094

Inventors:

Sang U. Kim - Tempe AZ
Mohammad K. Khan - Iselin NJ

Assignee:

Intel Corporation - Santa Clara CA

International Classification:

G01R 2726
G01R 3100

US Classification:

324158D

Abstract:

A novel technique to detect oxydonor generation in semiconductor wafers. Oxydonor generation in a P-type substrate may be sufficient to create a P-N junction within the substrate which may adversely affect device performance. A technique of the present invention is a two-step process for determining the presence of such an oxydonor generated P-N junction. For a capacitor device, the capacitance of the device is measured under varying test voltages to determine a capacitance-voltage response. Then a second capacitance-voltage response is measured when the device is subjected to an external energy source. For a diode device, the forward current is measured with the device under varying test voltages to determine a current-voltage response. Then a second currrent-voltage response is measured when the device is subjected to an external energy source. By comparing device response with and without the application of external energy, a device having oxydonor generation problems is efficiently detected.

US Patent:

48354589, May 30, 1989

Filed:

Nov 9, 1987

Appl. No.:

7/118256

Inventors:

Sang U. Kim - Tempe AZ

Assignee:

Intel Corporation - Santa Clara CA

International Classification:

G01R 1512
G11C 1140
G06F 1126

US Classification:

324 73R

Abstract:

An error testing process for the testing of CMOS static RAM memories. Individual static RAM memory cells that have failed are isolated. A typical cell has six transistors, two access, two n-channel and two p-channel. The access transistors are allowed to float which effectively isolates the cell. By application of voltages to the n-channel or p-channel transistors one set can be turned off and the remaining two n-channel or p-channel transistors can be tested with microprobes varying voltages for the forward and reverse bias testing. The graphs of the current flow from these tests are compared using the signature analysis technique so that not only the exact transistor which failed can be identified but the failure mechanism can also be identified. This process permits error testing without damage to the RAM memory and without physical isolation of the SRAM memory.