Scott J. Bowden - Hillsboro OR, US Jonathan P. Douglas - Olympia WA, US
Assignee:
Intel Corporation - Santa Clara CA
International Classification:
G01K007/42 G01K003/04 H03K003/01
US Classification:
374163, 327513, 702130
Abstract:
Techniques for preventing an integrated circuit (IC) from overheating are described herein. According to one embodiment, an exemplary process includes detecting whether a temperature of an integrated circuit (IC) exceeds a threshold independent of an operating state of the IC, and removing at least a portion of a power from the IC if the temperature of the IC exceeds the threshold. Other methods and apparatuses are also described.
Failsafe Mechanism For Preventing An Integrated Circuit From Overheating
Scott J. Bowden - Hillsboro OR, US Jonathan P. Douglas - Olympia WA, US
Assignee:
Intel Corporation - Santa Clara CA
International Classification:
G01K 7/42 G01K 3/04 H03K 3/01
US Classification:
374163, 374170, 327513, 702130
Abstract:
Techniques for preventing an integrated circuit (IC) from overheating are described herein. According to one embodiment, an exemplary process includes detecting whether a temperature of an integrated circuit (IC) exceeds a threshold independent of an operating state of the IC, and removing at least a portion of a power from the IC if the temperature of the IC exceeds the threshold. Other methods and apparatuses are also described.
Failsafe Mechanism For Preventing An Integrated Circuit From Overheating
Scott J. Bowden - Hillsboro OR, US Jonathan P. Douglas - Olympia WA, US
Assignee:
Intel Corporation - Santa Clara CA
International Classification:
G01K 7/42 G01K 3/04 H03K 3/01 G06F 1/26 G01F 1/07
US Classification:
374170, 702 99, 702130, 713500, 327513, 374163
Abstract:
Techniques for preventing an integrated circuit (IC) from overheating are described herein. According to one embodiment, an exemplary process includes detecting whether a temperature of an integrated circuit (IC) exceeds a threshold independent of an operating state of the IC, and removing at least a portion of a power from the IC if the temperature of the IC exceeds the threshold. Other methods and apparatuses are also described.
Wikipedia References
Scott Bowden
Isbn (Books And Publications)
Last Chance for Victory: Robert E. Lee and the Gettysburg Campaign
Intel Corporation
Manufacturing Architecture Manager, Director
Intel Corporation Apr 2016 - Oct 2018
Director of Engineering and Senior Manager of Dft Design and Methodology
Intel Corporation Sep 2010 - Apr 2016
Design For Test and Debug Team Manager
Intel Corporation Aug 2006 - Sep 2010
Senior Design Engineer
Intel Corporation Jun 2000 - Jan 2004
Design Engineer
Education:
Brigham Young University 1998 - 2000
Master of Science, Masters, Electrical Engineering
Brigham Young University 1992 - 1999
Bachelors, Bachelor of Science, Computer Engineering
Skills:
Debugging Processors Dft Rtl Design Logic Design Perl Verilog Jtag Testing Atpg Fpga Soc Static Timing Analysis Intel Logic Synthesis C Hardware Timing Joint Test Action Group System on A Chip
Sharp Electronics 2004 - 2017
Product Marketing
Sharp Microelectronics of the Americas 2006 - 2008
Product Manager - Display Products
Sharp Electronics Aug 2004 - Oct 2006
Senior Product Marketing Engineer
Zilog 1993 - 2000
Field Applications Engineer
Education:
Texas A&M University 1991 - 1992
Masters, Computer Engineering, Engineering
Portland State University 1989 - 1991
Master of Business Administration, Masters, Marketing, International Studies
Oregon State University 1973 - 1979
Bachelors, Bachelor of Science In Electrical Engineering, Bachelor of Science, Engineering, Chemistry
Skills:
Product Marketing Product Management Consumer Electronics Semiconductors Product Development Competitive Analysis Product Launch Cross Functional Team Leadership Embedded Systems Electronics Mobile Devices Ic Wireless Embedded Software Strategic Partnerships Market Analysis Key Account Management Business Strategy New Business Development Sales Management
Hillsboro, OR Boise, ID Provo, UT Charlotte, NC France Belgium Haifa, Israel
Work:
Intel - Computer Engineer
Education:
Brigham Young University, Provo, UT, Myers Park High School, Charlotte, NC, Centennial High School, Boise, ID, Lowell Scott Middle School, Boise, ID, Summerwind Elementary, Boise, ID
Scott Bowden
Work:
Trinity Mirror - IT Infrastructure Support Specialist
Jane Vincent, Dave Harris, Barbara Schust, June Johnson, Carol Ramsden, Gillian Graham, Michael Croft, Debra Sitter, Jan Fess, Savinia Parker, Jane Walker, Fletcher Mcivoy
Nayatt Elementary School Barrington RI 1965-1970, Peck Junior School Barrington RI 1970-1972, Barrington Middle School Barrington RI 1972-1974, Barrington High School Barrington RI 1973-1977
Community:
Donna Pettis, Nicholas Palmieri, Suzanne Leach, Leslie Smith, Bonnie Stiness