Shawn P Mckenney

US Patent:

20160061752, Mar 3, 2016

Filed:

Aug 28, 2015

Appl. No.:

14/839883

Inventors:

- Poway CA, US
Shawn McKenney - Ramona CA, US
Sean Simon - Vista CA, US
Peter Lam - San Diego CA, US

International Classification:

G01N 23/04
G01N 23/201

Abstract:

Techniques, systems, and devices are disclosed for analyzing a point of closest approach (PoCA) image of a volume of interest (VOI) comprising a set of recorded PoCA points from charged particle detector measurements to detect an object within the VOI. The VOI is partitioned into a set of equally-sized bins with each bin including a subset of the PoCA points. A bin metric is determined for each bin. A subset of the bins is selected based on the detected bin metric with the subset of bins being most likely to contain objects. A potential object for each selected bin is determined by determining a location and a size for the potential object based at least on the PoCAs inside the bin. A figure of merit (FOM) of the potential object is determined as a measure of the likelihood that the potential object is truly a threat object.

US Patent:

20160054458, Feb 25, 2016

Filed:

Aug 19, 2015

Appl. No.:

14/830590

Inventors:

- Poway CA, US
Michael James Sossong - Ramona CA, US
Shawn McKenney - Ramona CA, US
Thomas Taylor - St. Johns FL, US
Kolo Wamba - San Diego CA, US

International Classification:

G01T 7/00
G01T 1/29

Abstract:

A charged particle detector array includes one or more pairs of super modules, one super module in a pair of super modules is positioned above a volume of interest (VOI), and the other super module in the pair of super modules is positioned below the VOI. This calibration technique first calibrates individual super modules in the one or more pairs of super modules while treating each super module being calibrated as a rigid body. Each super module in the one or more pairs of super modules further includes multiple vertically-stacked modules, and each module in the multiple vertically-stacked modules is composed of multiple layers of drift tubes. The calibration technique then calibrates individual modules in each of the super modules while treating each module being calibrated as a rigid body. Next, the calibration technique calibrates individual drift tubes in each layer of the modules.

US Patent:

20150212014, Jul 30, 2015

Filed:

Aug 21, 2013

Appl. No.:

14/423381

Inventors:

- Poway CA, US
Shawn McKenney - Ramona CA, US
Robert Whalen - La Jolla CA, US
Gary Blanpied - Ramona CA, US
Andre Lehovich - San Diego CA, US
Priscilla Kurnadi - San Diego CA, US

Assignee:

Decision Sciences International Corporation - Poway CA

International Classification:

G01N 23/04
G01N 23/20
G01T 1/167

Abstract:

Techniques and systems for using cosmic ray-produced muons to inspect objects based on an initial scanning of all objects and an additional scanning of objects that are determined by the initial scanning to potentially include one or more suspect regions. In one implementation, a system can include a primary scanner for performing the initial or primary scanning and a smaller secondary scanner for the additional or secondary scanning to provide efficient and accurate inspection of objects while maintaining a desired throughput of the inspection. In another implementation, a single scanner can be used to perform both the initial scanning and the additional scanning while maintaining a sufficient throughput of a line of objects under inspection.