Siu Lee

US Patent:

6535015, Mar 18, 2003

Filed:

Apr 30, 2001

Appl. No.:

09/845266

Inventors:

Srinath Krishnan - Campbell CA
William G. En - Milpitas CA
Siu Lun Lee - Sunnyvale CA
Richard K. Klein - Mountain View CA

Assignee:

Advanced Micro Devices, Inc. - Sunnyvale CA

International Classification:

G01R 3102

US Classification:

324769, 3241581, 324765

Abstract:

An integrated test circuit for a silicon on insulator circuit structure is formed on the same wafer as the circuit structure. The wafer includes an input circuit coupled to the silicon on insulator circuit structure which generates a drive signal for operating the silicon on insulator circuit structure and an output circuit which processes a response signal from the circuit structure to generate an output signal representing certain characteristics of the silicon on insulator circuit structure.

US Patent:

42020190, May 6, 1980

Filed:

Feb 24, 1978

Appl. No.:

5/880906

Inventors:

Paul M. Popoff - Sunnyvale CA
Siu K. Lee - Sunnyvale CA
James J. Touchton - Boulder CO

Assignee:

Sperry Rand Corporation - New York NY

International Classification:

G11B 509

US Classification:

360 51

Abstract:

A timing circuit for a track following servo system wherein an odd servo track having a series of prerecorded odd dibits thereon and an adjacent even servo track having a series of even dibits prerecorded thereon are moved with respect to a servo head to induce in the servo head signals that vary with the occurrence of the dibits and have an amplitude representative of the lateral position of the servo head with respect to the servo tracks. The servo head and its associated preamplifier produce a first signal having portions from both odd and even servo tracks and a second signal that is the inverse of the first signal. The first and second signals are processed by parallel identical circuit paths to generate a clocking signal that times the remainder of the data storage system in synchronism with the spacing of dibits on the servo tracks. Each of the parallel identical circuit paths includes a circuit for discriminating between true dibits and spurious noise signals on the servo tracks, a counter circuit for passing only those dibit pulses that occur within a given time interval after the next preceding dibit, and a circuit for producing a timing pulse at a specified time after the preceding pulse to maintain system synchronization even in the absence of a dibit on one of the tracks.

US Patent:

39991334, Dec 21, 1976

Filed:

Jan 16, 1976

Appl. No.:

5/649867

Inventors:

Siu Kee Lee - Sunnyvale CA
John Cuda - Saratoga CA

Assignee:

Sperry Rand Corporation - New York NY

International Classification:

H03K 342

US Classification:

328 2

Abstract:

A circuit for controlling the gain of a transducer circuit by detecting the peak voltage of the transducer circuit, comparing the voltage with the reference voltage and modifying the output of the transducer circuit in a direction to adjust the output voltage towards a desired voltage.

US Patent:

20140114727, Apr 24, 2014

Filed:

Oct 25, 2013

Appl. No.:

14/063918

Inventors:

- Houston TX, US
Xin Zhang - San Jose CA, US
Shailendra K. Jain - Cupertino CA, US
Cipriano A. Santos - Modesto CA, US
Kay-Yut Chen - Santa Clara CA, US
Alfy Louis - Danville CA, US
Shawn G. Williams - Plano TX, US
Maria Teresa Gonzalez Diaz - Mountain View CA, US
Siu Po Lee - San Francisco CA, US

Assignee:

Hewlett-Packard Development Company, L.P. - Houston TX

International Classification:

G06Q 10/06

US Classification:

705 737

Abstract:

There is provided a computer-implemented method of generating a data forecasts for different levels of an entity. The method includes generating an aggregate forecast for an upper level entity comprised of two or more components. The method also includes determining mean values and a coefficient of variation for a probability distribution corresponding to future expected decomposition rates for each of the two or more components. A probability distribution parameter vector is computed based on the mean values and the coefficient of variation. The expected future decomposition rates for each of the two or more components may be computed based on the probability distribution parameter vector and a sample observation corresponding to previously observed decomposition values of each of the two or more components. Component forecasts corresponding to each of the two or more components may be computed based on the aggregate forecast and the expected future decomposition rates.