Sony Koshy Cheriyan

from New York, NY

Also known as:
  • Sony K Cheriyan
  • Cheriyan Sony Koshy
  • Cheriyan S Koshy
Phone and address:
70 Little West St APT 10F, New York, NY 10004

Sony Cheriyan Phones & Addresses

  • 70 Little West St APT 10F, New York, NY 10004
  • 77 Hudson St, Jersey City, NJ 07302
  • Saratoga Springs, NY
  • Springfield, NJ
  • Wichita, KS
  • 77 Hudson St APT 2410, Jersey City, NJ 07302

Us Patents

  • Sample Module With Sample Stream Supported And Spaced From Window, For X-Ray Analysis System

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  • US Patent:
    8625737, Jan 7, 2014
  • Filed:
    Feb 8, 2011
  • Appl. No.:
    13/023111
  • Inventors:
    Zewu Chen - Schenectady NY, US
    Sony Cheriyan - Jersey City NJ, US
    Kai Xin - Wynantskill NY, US
    Jay Burdett - Scotia NY, US
  • Assignee:
    X-Ray Optical Systems, Inc. - East Greenbush NY
  • International Classification:
    G01N 23/223
    G01N 21/01
    H05G 1/02
  • US Classification:
    378 44, 378 47, 378208
  • Abstract:
    An x-ray analysis system with an x-ray source for producing an x-ray excitation beam directed toward an x-ray analysis focal area; and a sample chamber for presenting a fluid sample to the x-ray analysis focal area. The x-ray excitation beam is generated by an x-ray engine and passes through an x-ray transparent barrier on a wall of the chamber, to define an analysis focal area within space defined by the chamber. The fluid sample is presented as a stream supported in the space and streaming through the focal area, using a support structure to guide the sample stream. The chamber's barrier is therefore separated from both the focal area and the sample, resulting in lower corruption of the barrier.
  • Compact, Low Noise Power Supply For Advanced Electronics Applications, And X-Ray Analyzer Applications Thereof

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  • US Patent:
    20120020463, Jan 26, 2012
  • Filed:
    Jul 26, 2011
  • Appl. No.:
    13/190556
  • Inventors:
    Ernest COOLEY - Rochester NY, US
    Sony CHERIYAN - Jersey City NJ, US
    Daniel DUNHAM - Averill Park NY, US
    Igor PONOMAREV - Albany NY, US
    Paul QUANTOCK - Stillwater NY, US
    Robert C. TATAR - Saratoga Springs NY, US
  • Assignee:
    X-RAY OPTICAL SYSTEMS, INC. - East Greenbush NY
  • International Classification:
    H05G 1/08
    H02M 7/217
  • US Classification:
    378101, 363 61
  • Abstract:
    A shielded, low-noise, high-voltage power supply having a plurality of voltage multipliers, each having a toroidal transformer, and collectively producing a high DC output voltage from an AC voltage. A main conductor carries the AC voltage, and is positioned proximate each toroidal transformer of the plurality of voltage multipliers. A conductive shell is conductively connected to the main conductor, and substantially encloses the plurality of voltage multipliers and the main conductor, the conductive shell providing a return path for the AC voltage in the main conductor and providing EMI shielding of the voltage multipliers and the main conductor. Other features are provided, including an intermediate transformer for conditioning/isolating the AC voltages.
  • Sample Viscosity And Flow Control For Heavy Samples, And X-Ray Analysis Applications Thereof

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  • US Patent:
    20130044858, Feb 21, 2013
  • Filed:
    Aug 14, 2012
  • Appl. No.:
    13/584978
  • Inventors:
    George ALLEN - Middle Grove NY, US
    Stuart SHAKSHOBER - Hudson NY, US
    Sony CHERIYAN - Jersey City NJ, US
  • Assignee:
    X-RAY OPTICAL SYSTEMS, INC. - East Greenbush NY
  • International Classification:
    G01N 23/00
    G01N 23/223
  • US Classification:
    378 44, 378208
  • Abstract:
    An x-ray analysis system having an x-ray engine with an x-ray source for producing an x-ray excitation beam directed toward an x-ray analysis focal area; a sample chamber for presenting a sample stream to the x-ray analysis focal area, the analysis focal area disposed within a sample analysis area defined within the chamber; an x-ray detection path for collecting secondary x-rays and directing the x-rays toward a detector; an x-ray transparent barrier on a wall of the chamber through which the x-rays pass; and a blocking structure partially blocking the sample analysis area, for creating sample stream turbulence in the sample analysis area and over the barrier. The blocking structure may be disposed asymmetrically about a central axis of the x-ray analysis focal area and/or the sample analysis area; and may be a rounded pin. A heating element may be used to heat the sample stream for improving flow.

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