Stephen E Lyon

US Patent:

8049163, Nov 1, 2011

Filed:

Sep 2, 2008

Appl. No.:

12/202896

Inventors:

Russell Granneman - Goleta CA, US
Nuwan Nagahawatte - Goleta CA, US
Richard M. Goeden - Goleta CA, US
Ted Takagi - Santa Maria CA, US
Robert Ernst - Carpinteria CA, US
Gary B. Hughes - Santa Maria CA, US
Joseph Kostrzewa - Buellton CA, US
John Graff - Santa Barbara CA, US
George Speake - Santa Barbara CA, US
Michael Kent - Goleta CA, US
Neela Nalam - Goleta CA, US
Stephen Lyon - Goleta CA, US
Barbara Sharp - Santa Barbara CA, US
Pierre Boulanger - Goleta CA, US
Neil Cutcliffe - Goleta CA, US
Tim Martin - Santa Barbara CA, US
Ted Hoelter - Goleta CA, US

Assignee:

Flir Systems, Inc. - Wilsonville OR

International Classification:

G01D 18/00
G01J 1/00
G01J 3/10

US Classification:

2502521, 2504951, 250504 R

Abstract:

Systems and methods directed to calibration techniques for infrared cameras are disclosed. For example, a method of obtaining calibration information for an infrared device includes providing a calibration target adapted to provide a low-emissivity scene; performing a calibration operation on the infrared device to obtain the calibration information; and storing the calibration information.

US Patent:

8378290, Feb 19, 2013

Filed:

Sep 2, 2008

Appl. No.:

12/202880

Inventors:

George Speake - Santa Barbara CA, US
Nuwan Nagahawatte - Goleta CA, US
Richard M. Goeden - Goleta CA, US
Ted Takagi - Santa Maria CA, US
Robert Ernst - Carpinteria CA, US
Gary B. Hughes - Santa Maria CA, US
Joseph Kostrzewa - Buellton CA, US
John Graff - Santa Barbara CA, US
Russell Granneman - Goleta CA, US
Michael Kent - Goleta CA, US
Neela Nalam - Goleta CA, US
Stephen Lyon - Goleta CA, US
Barbara Sharp - Santa Barbara CA, US
Pierre Boulanger - Goleta CA, US
Neil Cutcliffe - Goleta CA, US
Tim Martin - Santa Barbara CA, US
Ted Hoelter - Goleta CA, US

Assignee:

Flir Systems, Inc. - Wilsonville OR

International Classification:

G01J 5/22

US Classification:

2502521

Abstract:

Systems and methods directed to calibration techniques for infrared cameras are disclosed for some embodiments. For example, a method of determining infrared sensor calibration information, in accordance with an embodiment, includes performing a calibration operation on an infrared sensor to obtain calibration information, wherein the infrared sensor is not within an infrared camera core, and storing the calibration information.

US Patent:

20130087766, Apr 11, 2013

Filed:

Oct 4, 2012

Appl. No.:

13/645291

Inventors:

THE REGENTS OF THE UNIVERSITY OF CALIF - Oakland CA, US
Cheuk Chi LO - Berkeley CA, US
Christoph WEIS - Berkeley CA, US
Stephen LYON - Cranbury NJ, US
Alexei TYRYSHKIN - Yardley PA, US
Jeffrey BOKOR - Oakland CA, US

Assignee:

THE REGENTS OF THE UNIVERSITY OF CALIFORNIA - Oakland CA

International Classification:

H01L 29/06
H01L 21/02

US Classification:

257 31, 438 2, 257E29005, 257E21002

Abstract:

A quantum bit computing architecture includes a plurality of single spin memory donor atoms embedded in a semiconductor layer, a plurality of quantum dots arranged with the semiconductor layer and aligned with the donor atoms, wherein a first voltage applied across at least one pair of the aligned quantum dot and donor atom controls a donor-quantum dot coupling. A method of performing quantum computing in a scalable architecture quantum computing apparatus includes arranging a pattern of single spin memory donor atoms in a semiconductor layer, forming a plurality of quantum dots arranged with the semiconductor layer and aligned with the donor atoms, applying a first voltage across at least one aligned pair of a quantum dot and donor atom to control a donor-quantum dot coupling, and applying a second voltage between one or more quantum dots to control a Heisenberg exchange J coupling between quantum dots and to cause transport of a single spin polarized electron between quantum dots.