Stephen F Meier

US Patent:

6345379, Feb 5, 2002

Filed:

Aug 5, 1999

Appl. No.:

09/369657

Inventors:

Adel Khouja - Saratoga CA
Shankar Krishnamoorthy - Sunnyvale CA
Frederic G. Mailhot - Palo Alto CA
Stephen F. Meier - Sunnyvale CA

Assignee:

Synopsys, Inc. - Mountain View CA

International Classification:

G06F 1750

US Classification:

716 4, 716 5

Abstract:

This is a method of quickly computing the power dissipated by a digital circuit using information available at the gate library level. It estimates the short-circuit power by modeling the energy dissipated by the cell per input transition as a function of the transition time or edge rate, and multiplying that value by the number of transitions per second for that input.

US Patent:

6714017, Mar 30, 2004

Filed:

Nov 30, 2000

Appl. No.:

09/727952

Inventors:

Marius Enachescu - Richmond CA
Sergey Belikov - Palo Alto CA
Stephen F. Meier - Fremont CA

Assignee:

Candescent Technologies Corporation - Los Gatos CA
Candescent Intellectual Property Services, Inc. - Los Gatos CA

International Classification:

G01R 3100

US Classification:

324501, 324770, 2503418

Abstract:

A method and system for detecting electrical short circuit defects in a plate structure of a flat panel display, for example, a field emission display (FED) is disclosed. In one embodiment, the process first applies a stimulation to the electrical conductors of the plate structure. Next, the process creates an infra-red thermal mapping of a cathode region of the FED. For example, an infra-red array may be used to snap a picture of the cathode of the FED. Then, the process analyzes the infra-red thermal mapping to determine a region of the FED which contains the electrical short circuit defect. Another embodiment localizes the defect to one sub-pixel by performing an infra-red mapping of the region which the previous IR mapping process determined to contain the electrical short circuit defect. Then, the process analyzes this infra-red mapping to determine a sub-pixel of the FED which contains the electrical short circuit defect.

US Patent:

7532422, May 12, 2009

Filed:

Oct 25, 2006

Appl. No.:

11/552930

Inventors:

Stephen Frank Meier - Fremont CA, US
David H. Ferry - Boulder Creek CA, US
Hassan Jalalian - Saratoga CA, US

Assignee:

MRA TEK, LLC - Fremont CA

International Classification:

G11B 27/36

US Classification:

360 31, 360 53, 360 62

Abstract:

Disclosed are a method and system for distinguishing spatial and thermal defects on perpendicular media. The magnetic domains of the perpendicular media are oriented to have a first polarity, scanned using a read head, oriented to have a second polarity and scanned again. The signals from the read head are combined to produce output signals having improved signal to noise ratios from which the locations of spatial and thermal defects can be identified and distinguished.

US Patent:

7630154, Dec 8, 2009

Filed:

Apr 4, 2006

Appl. No.:

11/398033

Inventors:

Stephen Frank Meier - Fremont CA, US
David H. Ferry - Boulder Creek CA, US

Assignee:

MRA Tek, LLC - Fremont CA

International Classification:

G11B 5/02

US Classification:

360 25, 360 13

Abstract:

A method an apparatus for testing the surface of hard disk platters having vertically oriented magnetic domains is disclosed. According to the method of the present invention, all of the magnetic domains on the surface of the disk to be tested are oriented in the same direction, so that the magnetic field intensity adjacent to the surface is ideally uniform. The surface is then scanned using a read head to identify perturbations in the magnetic field intensity which correlate to surface defects.

US Patent:

7929235, Apr 19, 2011

Filed:

May 7, 2009

Appl. No.:

12/437425

Inventors:

Stephen Frank Meier - Fremont CA, US
David H. Ferry - Boulder Creek CA, US
Hassan Jalalian - Saratoga CA, US

Assignee:

MRA TEK, LLC - Fremont CA

International Classification:

G11B 27/36

US Classification:

360 31, 360 53, 360 59, 360 60, 360 62, 36012302

Abstract:

Disclosed are a method and system for distinguishing spatial and thermal defects on perpendicular media. The magnetic domains of the perpendicular media are oriented to have a first polarity, scanned using a read head, oriented to have a second polarity and scanned again. The signals from the read head are combined to produce output signals having improved signal to noise ratios from which the locations of spatial and thermal defects can be identified and distinguished.

US Patent:

8369038, Feb 5, 2013

Filed:

Mar 10, 2011

Appl. No.:

13/045485

Inventors:

Stephen Frank Meier - Fremont CA, US
David H. Ferry - Boulder Creek CA, US
Hassan Jalalian - Saratoga CA, US

Assignee:

MRA Tek LLC - Fremont CA

International Classification:

G11B 27/36

US Classification:

360 31, 360 53, 360 59, 360 62

Abstract:

Disclosed are a method and system for distinguishing spatial and thermal defects on perpendicular media. The magnetic domains of the perpendicular media are oriented to have a first polarity, scanned using a read head, oriented to have a second polarity and scanned again. The signals from the read head are combined to produce output signals having improved signal to noise ratios from which the locations of spatial and thermal defects can be identified and distinguished.

US Patent:

8473875, Jun 25, 2013

Filed:

Jun 25, 2011

Appl. No.:

13/168954

Inventors:

Akira Fujimura - Saratoga CA, US
Kazuyuki Hagiwara - Tokyo, JP
Stephen F. Meier - Sunnyvale CA, US
Ingo Bork - Mountain View CA, US

Assignee:

D2S, Inc. - San Jose CA

International Classification:

G06F 17/50

US Classification:

716 53

Abstract:

A method and system for fracturing or mask data preparation for charged particle beam lithography are disclosed in which accuracy and/or edge slope of a pattern formed on a surface by a set of charged particle beam shots is enhanced by use of partially-overlapping shots. In some embodiments, dosages of the shots may vary with respect to each other before proximity effect correction. Particle beam simulation may be used to calculate the pattern and the edge slope. Enhanced edge slope can improve critical dimension (CD) variation and line-edge roughness (LER) of the pattern produced on the surface.

US Patent:

20080172035, Jul 17, 2008

Filed:

Oct 18, 2006

Appl. No.:

11/583627

Inventors:

Niel F. Starksen - Los Altos Hills CA, US
Karl S. Im - San Jose CA, US
Mariel Fabro - Mountain View CA, US
Stephen Meier - Santa Clara CA, US
Eugene Serina - Union City CA, US

International Classification:

A61M 31/00

US Classification:

604508

Abstract:

Methods and devices for successively advancing a plurality of catheters over a guide element to a body tissue are described. In some of the methods, the guide element may be attached to the body tissue, which may be accessible minimally invasively. In certain variations, the guide element may not be detached from the body tissue after the catheters have been advanced over the guide element. The methods may further comprise deploying at least one implant from at least one of the plurality of catheters. In some variations, a method may comprise advancing a first delivery catheter to a first region of a body tissue, deploying a first anchor from the first delivery catheter, where the first anchor is attached to a guide element, proximally withdrawing the first delivery catheter, advancing a second delivery catheter over the guide element, and deploying a second anchor from the second delivery catheter.