Stephen M Ray

US Patent:

6410350, Jun 25, 2002

Filed:

Jun 29, 2000

Appl. No.:

09/607150

Inventors:

Mark Brandon Fuselier - Austin TX
Stephen Doug Ray - Austin TX
Michael James Dunn - Austin TX
Roger T. Williams - Austin TX
Michael V. Fenske - Round Rock TX

Assignee:

Advanced Micro Devices - Austin TX

International Classification:

H01L 2166

US Classification:

438 14, 438 15, 438 18

Abstract:

An apparatus and method for detecting speed variations across a die, a flash field, i. e. , multiple dies, and multiple flash fields. In one embodiment, a method comprises the step of inserting a plurality of functional circuits at strategic locations across a die or flash field or multiple flash fields where each of the plurality of functional circuits generates data, e. g. , values, frequency, etc. , correlated to the die speeds at the strategic locations. The method further comprises reading the data generated by the plurality of functional circuits that may be correlated to the die speeds at the strategic locations. Speed variations across the die or flash field or multiple flash fields may then be subsequently detected based on the data generated by the plurality of functional circuits. Upon analyzing the data generated by the plurality of functional circuits, adjustments may be made to the manufacturing process to improve the number of acceptable integrated circuits or chips disposed in the dies.