Stephen D Reimers

US Patent:

20130145506, Jun 6, 2013

Filed:

Nov 19, 2012

Appl. No.:

13/680724

Inventors:

Jay B. Dean - Land O'Lakes FL, US
Dominic P. D'agostino - Tampa FL, US
Stephen Reimers - Lorton VA, US
Ramesh K. Dixit - Woodbridge VA, US

International Classification:

G01Q 60/24

US Classification:

850 9, 850 33

Abstract:

In some embodiments, a system for performing microscopy at hyperbaric pressures includes a hyperbaric chamber that defines a sealed interior space, and an imaging system contained within the interior space that is operated from outside of the hyperbaric chamber to image materials within the interior space at hyperbaric pressures.

US Patent:

43122337, Jan 26, 1982

Filed:

Jan 31, 1980

Appl. No.:

6/117209

Inventors:

Stephen D. Reimers - Falls Church VA
Larry L. Wischhoefer - Washington DC

International Classification:

G01F 1502

US Classification:

7386101

Abstract:

A flow rate meter correction device for fluid supply systems, wherein actual meter conditions and/or end use point conditions vary substantially from meter calibration conditions, having a variable length scale for indicating actual (corrected) flow in appropriate units means for calculating a correction factor reflecting the deviation of actual meter indication (pointer movement, etc) from meter indication under meter calibration conditions, and means responsive to the correction factor for interrelating the meter indicator with the variable length scale. The variable length scale indication is positionable relative to the meter indication by positioning means associated with the calculating means.