Steve A Munroe

US Patent:

20070118315, May 24, 2007

Filed:

Nov 10, 2005

Appl. No.:

11/271507

Inventors:

Michael Panis - Somerville MA, US
Steve Munroe - Lakeway TX, US
John Pane - Tigard OR, US

Assignee:

Teradyne, Inc. - Boston MA

International Classification:

G01R 29/26

US Classification:

702069000

Abstract:

A method of jitter measurement is provided and includes sampling a device-under-test (DUT) output signal, having a repeating pattern, using an asynchronous clock over a desired period of time and mapping the samples onto a single period of the repeating pattern. Each period of the repeating pattern is sampled at least twice. A sampling frequency of the asynchronous clock is based on user inputs. Sampling the DUT signal comprises capturing logical state information representing each edge of a single period of the DUT signal at least once. The method further includes, separating the samples into subsets and mapping the sample subsets onto a single period of the repeating pattern wherein the samples within a particular subset are mapped to a set of times which are in the same order as in which the samples were obtained, processing the samples within each subset independently of samples in other subsets, and combining results of the processed subsets and processing the combined results of the subsets.