Steve R Tuszynski

US Patent:

7072808, Jul 4, 2006

Filed:

Feb 4, 2002

Appl. No.:

10/067704

Inventors:

Steve W. Tuszynski - Los Angeles CA, US

International Classification:

G06F 17/10

US Classification:

703 2, 700 33

Abstract:

Methods, apparatuses and systems that facilitate the design, production and/or measurement tasks associated with manufacturing and other processes. In one embodiment, the present invention provides an understanding of how the multiple characteristics of a given process output are related to each other and to process inputs. This knowledge facilitates a reduction in measurement costs. It also facilitates an understanding of the sometimes complex interrelationships between design targets, design tolerances, process inputs, process control variables, average process output and variation in the process output. As discussed in more detail below, embodiments of the present invention facilitate 1. ) determination of design target values, 2. ) determination of design specification limits, 3.

US Patent:

7187992, Mar 6, 2007

Filed:

Jan 7, 2004

Appl. No.:

10/752843

Inventors:

Steve W. Tuszynski - Los Angeles CA, US

International Classification:

G06F 19/00

US Classification:

700 97, 703 2

Abstract:

Methods, apparatuses and systems that facilitate the design, production and/or measurement tasks associated with manufacturing and other processes. In one embodiment, the present invention relates to decision-making and logic structures, implemented in a computer software application, facilitating all phases of the design, development, tooling, pre-production, qualification, certification, and production process of any part or other article that is produced to specification. In one embodiment, the present invention provides knowledge of how the multiple characteristics of a given process output are related to each other, to specification limits and to pre-process inputs. This knowledge facilitates a reduction in measurement, analysis and reporting costs both prior to and during production. It also determines the changes needed to pre-process inputs in order to achieve production at design targets. It provides a prioritized order for relaxing design tolerances.

US Patent:

7239991, Jul 3, 2007

Filed:

Jul 27, 2004

Appl. No.:

10/900732

Inventors:

Steve W. Tuszynski - Los Angeles CA, US

International Classification:

G06F 17/10

US Classification:

703 2, 700 13

Abstract:

A process simulation system that simulates the operation of the manufacturing and measurement systems used to produce and measure the articles being analyzed relative to engineering design targets, engineering design tolerances, producibility and/or quality. In one embodiment, the user is able to assess, without risk or production cost while accelerating speed-to-market, the effect of contemplated changes (i. ) to engineering design targets, (ii. ) to engineering design tolerances, (iii. ) to tooling, (iv. ) to part pre-process dimensions and (v. ) to the measurement system—on manufactured part dimensions, producibility and quality (i. ) without modifying tooling, (ii. ) without changing part pre-process dimensions, (iii. ) without producing new parts, (iv. ) without measuring article characteristics on the new parts and (v.

US Patent:

7321848, Jan 22, 2008

Filed:

Jul 13, 2005

Appl. No.:

11/180244

Inventors:

Steve W. Tuszynski - Los Angeles CA, US

International Classification:

G06F 17/10

US Classification:

703 2, 700 33

Abstract:

Methods, apparatuses and systems that facilitate the design, production and/or measurement tasks associated with manufacturing and other processes. In one embodiment, the present invention provides an understanding of how the multiple characteristics of a given process output are related to each other and to process inputs. This knowledge facilitates a reduction in measurement costs. It also facilitates an understanding of the sometimes complex interrelationships between design targets, design tolerances, process inputs, process control variables, average process output and variation in the process output. As discussed in more detail below, embodiments of the present invention facilitate 1. ) determination of design target values, 2. ) determination of design specification limits, 3.

US Patent:

7660642, Feb 9, 2010

Filed:

Oct 20, 2006

Appl. No.:

11/551331

Inventors:

Steve W. Tuszynski - Los Angeles CA, US

International Classification:

G06F 19/00
G05B 13/02

US Classification:

700 97, 700 29

Abstract:

Methods, apparatuses and systems that facilitate the design, production, control and/or measurement tasks associated with manufacturing and other processes. In one embodiment, the present invention provides an understanding of how the multiple characteristics of a given process output are related to each other and to process inputs. It also facilitates an understanding of the sometimes complex interrelationships between design targets, design tolerances, process inputs, process control variables, average process output and variation in the process output. In one implementation, the present invention enables or facilitates the implementation of static and dynamic control systems in connection with manufacturing or other process. For example, in one implementation, the present invention provides a dynamic control system for manufacturing processes that is responsive to the observed output of a process.

US Patent:

7672745, Mar 2, 2010

Filed:

Mar 20, 2006

Appl. No.:

11/384749

Inventors:

Steve W. Tuszynski - Los Angeles CA, US

International Classification:

G06F 19/00
G05B 13/02

US Classification:

700 97, 700 29

Abstract:

Methods, apparatuses and systems that facilitate the design, production and/or measurement tasks associated with manufacturing and other processes. The present invention, in one implementation, provides methods, apparatuses and systems directed to facilitating the optimization or improvement of manufacturing processes relative to one or more criteria. In some implementations, the present invention facilitates the optimization of manufacturing processes relative to one or more attributes—such as cycle time, cost, and performance—while still optimizing process output relative to design specifications for a given article characteristic.

US Patent:

7840297, Nov 23, 2010

Filed:

Mar 14, 2008

Appl. No.:

12/048534

Inventors:

Steve W. Tuszynski - Los Angeles CA, US

International Classification:

G06F 19/00
G06F 11/30
G06F 15/18
G05B 13/02
G21C 17/00
G06E 1/00
G06E 3/00
G06G 7/00

US Classification:

700108, 700 29, 700 33, 700 44, 700103, 702182, 706 21

Abstract:

Methods, apparatuses and systems that facilitate the design, production, control and/or measurement tasks associated with manufacturing and other processes. In one implementation, the present invention facilitates or enables the use of indirect process variables for use in manufacturing or other processes that yield articles or parts. For example, it enables determining a desired value profile for an indirect process variable based on the operating target, the lower operating limit and the upper operating limit for the predictor characteristic, and observations of the process. In one implementation, the present invention facilitates qualifying articles resulting from the process by comparing the desired versus observed value profiles for an indirect process variable. In another implementation, the present invention facilitates controlling a direct process variable based on the observed versus desired values of an indirect process variable.

US Patent:

7917234, Mar 29, 2011

Filed:

May 11, 2007

Appl. No.:

11/747427

Inventors:

Steve W. Tuszynski - Los Angeles CA, US

International Classification:

G06F 19/00
G05B 13/02

US Classification:

700 33, 703 2

Abstract:

Methods, apparatuses and systems that facilitate the design, production and/or measurement tasks associated with manufacturing and other processes. In one embodiment, the present invention provides an understanding of how the multiple characteristics of a given process output are related to each other and to process inputs. This knowledge facilitates a reduction in measurement costs. It also facilitates an understanding of the sometimes complex interrelationships between design targets, design tolerances, process inputs, process control variables, average process output and variation in the process output. As disclosed in more detail below, embodiments of the present invention facilitate 1. ) determination of design target values, 2. ) determination of design application limits, 3.