Christopher E. White - Plano TX, US Steven C. McMahan - Richardson TX, US John K. Eitrheim - Plano TX, US
Assignee:
Cisco Technology, Inc. - San Jose CA
International Classification:
G11C 29/00
US Classification:
714718, 714733, 714 30
Abstract:
Testing one or more memories of a device includes receiving one or more first repair records from one or more built-in self-testers of a device having one or more memories. A built-in self-tester is associated with a memory, and a first repair record describes a first repair at a memory. A first repair signature corresponding to the first repairs at the memories is generated from the first repair records, and then is recorded. One or more second repair records are received from the built-in self-testers, where a second repair record describes a second repair at a memory. A second repair signature corresponding to the second repairs at the memories is generated from the second repair records. The second repair signature is compared with the first repair signature. The device is evaluated in response to the comparison.
Christopher E. White - Plano TX, US Steven C. McMahan - Richardson TX, US John K. Eitrheim - Plano TX, US
Assignee:
Cisco Technology, Inc. - San Jose CA
International Classification:
G01C 29/00 G01R 31/28
US Classification:
714718, 714733, 714734
Abstract:
Testing one or more memories of a device includes receiving one or more first repair records from one or more built-in self-testers of a device having one or more memories. A built-in self-tester is associated with a memory, and a first repair record describes a first repair at a memory. A first repair signature corresponding to the first repairs at the memories is generated from the first repair records, and then is recorded. One or more second repair records are received from the built-in self-testers, where a second repair record describes a second repair at a memory. A second repair signature corresponding to the second repairs at the memories is generated from the second repair records. The second repair signature is compared with the first repair signature. The device is evaluated in response to the comparison.
Data Processor Having An Output Terminal With Selectable Output Impedances
Steven Craig McMahan - Garland TX Kenneth Charles Scheuer - Austin TX William Burl Ledbetter - Austin TX Michael Gordon Gallup - Austin TX James George Gay - Pflugerville TX
Assignee:
Motorola, Inc. - Schaumburg IL
International Classification:
H03K 1716 H03K 190175
US Classification:
326 30
Abstract:
A data processor has at least one output terminal which a user of the data processor can vary the output impedance thereof depending upon the application environment of the data processor. A first output buffer of an output buffer stage has a predetermined output impedance and is coupled between an input of the stage and the output terminal. The first output buffer provides a first output terminal impedance. A second output buffer having a lower output impedance than the first output buffer may be selectively coupled in parallel to the first output buffer to reduce the output impedance of the output terminal. The coupling of the output buffers is controlled by a user of the data processor who provides a control input for selecting one of a plurality of predetermined output terminal impedance values.
Processor With Single Clock Decode Architecture Employing Single Microrom
Mark W. Bluhm - Plano TX Mark W. Hervin - Dallas TX Steven C. McMahan - Richardson TX Raul A. Garibay - Richardson TX
Assignee:
Cyrix Corporation - Richardson TX
International Classification:
G06F 922
US Classification:
395376
Abstract:
A processor includes storage circuitry for storing an instruction and memory circuitry addressable by a microaddress for outputting a microinstruction in response to the microaddress. The processor further includes sequencing circuitry coupled to provide the microaddress to the memory circuitry. Finally, the processor includes decode circuitry coupled to the storage circuitry for detecting whether the instruction stored in the storage circuitry comprises a single clock instruction before the memory circuit outputs the microinstruction, and for indicating to the sequencing circuitry in response to detecting whether the instruction stored in the storage circuitry comprises a single clock instruction.
Adjusting Prefetch Size Based On Source Of Prefetch Address
A prefetch unit is used, in an exemplary embodiment, in a superscalar, superpipelined microprocessor compatible with the x86 instruction set architecture. Normally, the prefetch unit performs split prefetching by generating low and high prefetch addresses in a single clock, with the high prefetch address being generated from the low prefetch address by incrementation. In cases where the low prefetch address is supplied to the prefetch unit too late in a clock period to generate the high prefetch address, such as where a branch instruction is not detected by a branch processing unit so that the target instruction address (i. e. , the low prefetch address) is supplied by an address calculation stage, the prefetch unit generates a prefetch request consisting of only the low prefetch address. In an exemplary embodiment each prefetch request is for an 8 byte block of instruction bytes, such that the high prefetch address is generated by adding an 8-bit value to the low prefetch address, and, for low prefetch addresses supplied late, the prefetch unit detects whether the low prefetch address has a �0! in bit position 3, and if so, generates the high prefetch address by toggling the bit position n to a �1! (because the no carry ripple will affect the higher order bits).
Branch Processing Unit With Target Cache Using Low/High Banking To Support Split Prefetching
A branch processing unit (BPU) is used, in an exemplary embodiment, in a superscalar, superpipelined microprocessor compatible with the x86 instruction set architecture. The BPU includes a target cache organized in banks to support split prefetching. Prefetch requests (addressing a prefetch block of 16 bytes) are separated into low and high block addresses (addressing split blocks of 8 bytes). The low and high block addresses differ in bit position �3! designated a bank select bit, where the low block address of an associated prefetch request may be designated by a �1 or 0! such that a split block associated with a low block address may be allocated into either bank of the target cache (i. e. , the low block of a prefetch request can start on an 8 byte alignment rather than the 16 byte alignment). For each prefetch request that includes both low and high block addresses, respective banks of the target cache are successively accessed based on the state of the bank select bit, such that the low block address is used to access one bank and the high block address is used to access the other bank.
Condensed Microaddress Generation In A Complex Instruction Set Computer
Steven C. McMahan - Richardson TX Mark W. Bluhm - Plano TX
Assignee:
Cyrix Corporation - Richardson TX
International Classification:
G06F 1202
US Classification:
395381
Abstract:
A microarchitecture in a complex instruction computer system is disclosed employing a sparse microROM array and concatenation address circuitry for forming microaddress entry points, avoiding the need for a programmable logic array to translate instruction opcodes and avoiding duplicative entry points, thus minimizing the microROM array size.
Data Processor Having An Output Terminal With Selectable Output Impedances
Steven C. McMahan - Richardson TX Kenneth C. Scheuer - Austin TX William B. Ledbetter - Austin TX Michael G. Gallup - Austin TX James G. Gay - Pflugerville TX
Assignee:
Motorola, Inc. - Schaumburg IL
International Classification:
H03K 19003
US Classification:
307443
Abstract:
A data processor has at least one output terminal which a user of the data processor can vary the output impedance thereof depending upon the application environment of the data processor. A first output buffer of an output buffer stage has a predetermined output impedance and is coupled between an input of the stage and the output terminal. The first output buffer provides a first output terminal impedance. A second output buffer having a lower output impedance than the first output buffer may be selectively coupled in parallel to the first output buffer to reduce the output impedance of the output terminal. The coupling of the output buffers is controlled by a user of the data processor who provides a control input for selecting one of a plurality of predetermined output terminal impedance values.
Name / Title
Company / Classification
Phones & Addresses
Steven Mcmahan
SABRE LEASING, LLC
Steven A. Mcmahan Director, President, Principal
UCANDOIT, INC Nonclassifiable Establishments
PO Box 191061, Dallas, TX 75219 7201 Baker Blvd, Fort Worth, TX 76118 4606 Cedar Spg Rd, Dallas, TX 75219
Dr. Mcmahan graduated from the University of Arkansas College of Medicine at Little Rock in 1996. He works in West Monroe, LA and 1 other location and specializes in Family Medicine.
Anchor Point Technology Resources
Sap Security Administrator
Ibm 2012 - 2012
Consultant
Eli Lilly and Company 2006 - 2011
Associate Consultant - It
Eli Lilly and Company 1999 - 2006
Associate Information Consultant
Education:
Indiana University - Kelley School of Business 1978 - 1981
Master of Business Administration, Masters, Finance
Indiana University Bloomington 1971 - 1975
Bachelors, Biology
Skills:
Sap Implementation Master Data Management Sap R/3 Sap Erp Business Intelligence Business Analysis Abap Sap Netweaver Erp It Strategy Sap Business Process Sap Bw Requirements Analysis Business Objects Enterprise Resource Planning Sap Products