Steven E Start

US Patent:

20140052404, Feb 20, 2014

Filed:

Aug 15, 2012

Appl. No.:

13/586048

Inventors:

Coralyn S. Gauvin - Manitou Springs CO, US
Steven E. Start - Colorado Springs CO, US
Carl Gygi - Colorado Springs CO, US

Assignee:

LSI CORPORATION - Milpitas CA

International Classification:

G06F 19/00

US Classification:

702120

Abstract:

Methods and structure are disclosed for analyzing different signaling pathways through a test signal selection hierarchy utilizing test patterns. One embodiment comprises an integrated circuit that includes a block of circuitry, a test signal generator, and a test signal selection hierarchy. The block of circuitry generates internal operational (TOP) signals for performing functions. The test signal generator generates test patterns that correspond with the IOP signals. The test signal selection hierarchy receives IOP signals and the test patterns, and selectively routes received signals to test pads. The test signal selection hierarchy routes the test patterns via signaling pathways through the test signal selection hierarchy to provide outputs signals on the test pads. The output signals are usable by an external test system to determine two or more of: a crosstalk, inter-symbol interference, a signal skew, and a threshold voltage for detecting bit transition on signaling pathways.