Steven M Walker

US Patent:

7355422, Apr 8, 2008

Filed:

Mar 6, 2006

Appl. No.:

11/369343

Inventors:

Steven J Walker - Monrovia CA, US

Assignee:

Touchdown Technologies, Inc. - Baldwin Park CA

International Classification:

G01R 31/02

US Classification:

324754

Abstract:

A novel probe card that comprises a set of fiducials and a method for using the same are disclosed. The set of fiducials comprises a first fiducial and a second fiducial fixed relative to the probe card substrate. Comparing the relative positions of the fiducials determines whether the probes are in proper alignment. This can be performed by the unaided eye or by using a low powered microscope. This novel probe card may also be used with computer vision alignment methods, thus enhancing the speed and accuracy of the computer vision method.

US Patent:

7365551, Apr 29, 2008

Filed:

Sep 26, 2006

Appl. No.:

11/535219

Inventors:

Steven J. Walker - Monrovia CA, US

Assignee:

Touchdown Technologies, Inc. - Baldwin Park CA

International Classification:

G01R 31/02

US Classification:

324754

Abstract:

A novel structure for a probe card that comprises a deformable metal or other deformable material for detecting excess overdrive and a method for using the same are disclosed. This detection structure may be positioned on the substrate along the bending path of the probe, such that should the probe experience excess overdrive, then the detection structure will permanently deform where it is hit by any portion of the probe. Alternatively, the detection structure may be embedded in the substrate, and may also function as a fiducial for alignment detection. Inspection of the probe card, and specifically the detection structure, will reveal whether any probe has experienced excess overdrive. Should the inspection reveal that certain regions of the card experienced excess overdrive, this may indicate a planarity problem that affects production line yield.