Steven Wayne Whitman

US Patent:

7636449, Dec 22, 2009

Filed:

Nov 12, 2004

Appl. No.:

10/987497

Inventors:

Brian V. Mirtich - Medfield MA, US
Andrew Eames - Ashland MA, US
Brian S. Phillips - Sherborn MA, US
John F. Keating - Medway MA, US
Steven Whitman - Danville NH, US

Assignee:

Cognex Technology and Investment Corporation - Mt. View CA

International Classification:

G06K 9/00

US Classification:

382100, 382141, 382145, 382152

Abstract:

This invention provides a system and method for automating the setup of Locators and Detectors within an image view of an object on the HMI of a vision detector by determining detectable edges and best fitting the Locators and Detectors to a location on the object image view following the establishment of an user selected operating point on the image view, such as by clicking a GUI cursor. In this manner, the initial placement and sizing of the graphical elements for Locator and Detector ROIs are relatively optimized without excessive adjustment by the user. Locators can be selected for direction, including machine or line-movement direction, cross direction or angled direction transverse to cross direction and movement direction. Detectors can be selected based upon particular analysis tools, including brightness tools, contrast tools and trained templates. The Locators and detectors are each associated with a particular set of operating parameters, such as activation threshold, which are displayed in a control box within the GUI (and can be accessed by clicking on the specific Locator or Detector.

US Patent:

52148416, Jun 1, 1993

Filed:

Sep 23, 1992

Appl. No.:

7/949315

Inventors:

James V. Howard - Saugus MA
William H. Mirley - N. Reading MA
Steven M. Whitman - Danville NH
Rodney P. Jackson - Auburn NH
William J. Loconzolo - Wakefield MA

Assignee:

Emhart Inc. - Newark DE

International Classification:

H05K 330

US Classification:

29721

Abstract:

The geometric features of a supported component in a machine for mounting surface mount electronic components are either frontlighted or backlighted for inspection purposes. To backlight the features a fluorescent surface above the component is excited with UV light. Since UV light reflected from the component is invisible to the camera system, the features will appear black with a bright background. To frontlight the features, a light source is used which generates light outside the UV range and a) having a wavelength corresponding to the wavelength of the UV fluorescing surface so that no fluorescent is created or b) having a wavelength substantially different from the UV fluorescing surface that is absorbed by the surface without causing fluorescing to take place. This light when reflected from the features is seen by the camera and the features will appear bright in a dark background.

US Patent:

49598988, Oct 2, 1990

Filed:

May 22, 1990

Appl. No.:

7/527079

Inventors:

Marc M. Landman - Burlington MA
Steven M. Whitman - Danville NH
Robert J. Duncan - Magnolia MA

Assignee:

Emhart Industries, Inc. - Towson MD

International Classification:

H05K 330

US Classification:

29705

Abstract:

Apparatus for performing a non-contact three-dimensional inspection of a surface-mount component prior to placement on a printed circuit board. Specifically, an arrangement to ensure acceptable alignment (i. e. coplanarity) of all component heads in the XZ or YZ plane, where XY is the plane of the component. The apparatus is embodied within a conventional pick and place machine and performs critical, in-process, lead coplanarity inspection.