Sumit Puri

US Patent:

20140059278, Feb 27, 2014

Filed:

Nov 12, 2012

Appl. No.:

13/988741

Inventors:

Karl Huan-Yao Ko - Sunnyvale CA, US
Aloysius C. Ashley Wijeyeratnam - Newark CA, US
Steven Gaskill - Campbell CA, US
Thad Omura - Los Altos CA, US
Sumit Puri - Fremont CA, US
Jeremy Isaac Nathaniel Werner - San Jose CA, US

Assignee:

LSI CORPORATION - San Jose CA

International Classification:

G06F 12/02

US Classification:

711103

Abstract:

Storage device FirmWare (FW) and manufacturing software techniques include access to FW images and communication of a manufacturing software tool. The manufacturing software tool enables download of the FW images into an I/O device and controlling a manufacturing test of the I/O device that is a storage device providing a storage capability. Execution of the downloaded FW images enables an I/O controller of the I/O device to provide the storage capability via operation with one or more selected types of flash memory devices. The selected types are selected from a plurality of flash memory types that the I/O controller is capable of operating with by executing appropriate ones of the FW images. Optionally the manufacturing test includes testing the storage capability of the I/O device. The techniques further include an SSD manufacturing self-test capability.

US Patent:

20130124932, May 16, 2013

Filed:

Mar 30, 2012

Appl. No.:

13/436639

Inventors:

Karl David SCHUH - Santa Cruz CA, US
Karl Huan-Yao KO - Sunnyvale CA, US
Aloysius C. Ashley WIJEYERATNAM - Newark CA, US
Steven GASKILL - Campbell CA, US
Thad OMURA - Los Altos CA, US
Sumit PURI - Fremont CA, US
Jeremy Isaac Nathaniel WERNER - San Jose CA, US

Assignee:

LSI CORPORATION - Milpitas CA

International Classification:

G11C 29/08

US Classification:

714718

Abstract:

A Solid-State Disk (SSD) Manufacturing Self Test (MST) capability enables an SSD manufacturer to generate and load tests onto SSDs, run the tests, and gather results. The SSDs self execute the loaded tests when powered up. The self executing is while coupled to a host that loaded the tests or while coupled to a rack unable to load the tests but enabled to provide power to the SSDs. The rack is optionally cost-reduced to enable cost-efficient parallel testing of relatively larger numbers of SSDs for production. The host writes the tests to an ‘input’ SMART log of each SSD, and each SSD writes results to a respective included ‘output’ SMART log. The commands include write drive, erase drive, SATA PHY burn-in, delay, and stress mode. The SSD MST capability is optionally used in conjunction with an SSD virtual manufacturing model.

US Patent:

20160293274, Oct 6, 2016

Filed:

Apr 1, 2016

Appl. No.:

15/089068

Inventors:

- Cupertino CA, US
Karl Huan-Yao Ko - Sunnyvale CA, US
Aloysius C. Ashley Wijeyeratanam - Newark CA, US
Steven Gaskill - Campbell CA, US
Thad Omura - Los Altos CA, US
Sumit Puri - Fremont CA, US
Jeremy Isaac Nathaniel Werner - San Jose CA, US

International Classification:

G11C 29/38
G11C 29/44
H04L 9/08
G11C 29/36

Abstract:

Storage device FirmWare (FW) and manufacturing software techniques include access to FW images and communication of a manufacturing software tool. The manufacturing software tool enables download of the FW images into an I/O device and controlling a manufacturing test of the I/O device that is a storage device providing a storage capability. Execution of the downloaded FW images enables an I/O controller of the I/O device to provide the storage capability via operation with one or more selected types of flash memory devices. The selected types are selected from a plurality of flash memory types that the I/O controller is capable of operating with by executing appropriate ones of the FW images. Optionally the manufacturing test includes testing the storage capability of the I/O device. The techniques further include an SSD manufacturing self-test capability.

US Patent:

20140208004, Jul 24, 2014

Filed:

Oct 23, 2013

Appl. No.:

14/060799

Inventors:

- San Jose CA, US
Sumit Puri - San Jose CA, US

Assignee:

LSI Corporation - San Jose CA

International Classification:

G06F 12/02

US Classification:

711103

Abstract:

A method for using a partitioned flash transition layer is disclosed. Step (A) receives, at an apparatus from a host, a write command having first write data. Step (B) generates second write data by compressing the first write data in the apparatus. The second write data generally has a variable size. Step (C) stores the second write data at a physical location in a nonvolatile memory. The physical location is a next unwritten location. Step (D) returns, from the apparatus to the host in response to the write command, an indication of the physical location.

Address:

10340 Anderson Rd, San Jose, CA 95127

Phone:

4088295252

VIN:

5FNRL5H93BB095530

Make:

HONDA

Model:

ODYSSEY

Year:

2011