Susan B Conti

US Patent:

20100145646, Jun 10, 2010

Filed:

Dec 8, 2008

Appl. No.:

12/329868

Inventors:

Robert Jeffrey Baseman - Brewster NY, US
Susan G. Conti - Hopewell Junction NY, US
William A. Muth - Lagrangeville NY, US
Michal Rosen-Zvi - Jerusalem, IL
Frederick A. Scholl - Hopewell Junction NY, US

International Classification:

G06F 19/00

US Classification:

702 81

Abstract:

Techniques for estimating a quality of one or more wafers are presented. One or more first wafers comprising one or more first dies are tested. A probability of wafer failure is determined in accordance with one or more first test measurements of the one or more first dies. A pass status and/or a fail status of one or more second wafers is inferred by testing a select one or more second dies of the one or more second wafers and evaluating one or more second test measurements of the select one or more second dies in accordance with the determined probability of wafer failure.