Lam Research
Engineering Manager, Metrology Technical Services
Us Nonviolent Peaceforce Chapters Association Oct 2008 - Oct 2016
Communications and It Specialist
Oregon Fellowship of Reconciliation Sep 2014 - Aug 2016
Chairperson
Oregon Peace Institute Mar 2010 - Jan 2016
Board Member
Lam Research Mar 2010 - Jan 2016
Sem Lab Supervisor
Education:
University of Washington 2006 - 2008
Master of Library & Information Studies, Masters, Information Science
University of Kentucky Sep 1984 - May 1991
Bachelors, Bachelor of Science In Electrical Engineering, Bachelor of Science, Physics
Skills:
Scanning Electron Microscopy Fib Physics Materials Science Design of Experiments Metrology Semiconductors Tem Nanotechnology Afm Optics Testing Research Failure Analysis Electronics Characterization Sem Web Development Project Management Technical Writing Product Management Data Analysis Html Unix Troubleshooting Matlab Editing R&D Wordpress Start Ups Nanofabrication Javascript Electron Microscopy Windows Powder X Ray Diffraction Microscopy Jmp Analysis Materials Drupal Digital Imaging
Jennifer Lynn Drown - Orlando FL Kim Elshot - Winter Park FL Erik Cho Houge - Orlando FL Terri Lynn Shofner - North Plains OR Tingkwan Cheung - Singapore, SG
Assignee:
Agere Systems, Inc. - Allentown PA
International Classification:
G01N 23203
US Classification:
250307, 250306, 250310
Abstract:
The present invention provides and apparatus and method for scanning a crystalline sample comprising a sample holder, an electron source for generating an electron beam and a scanning actuator for controlling the relative movement between the electron beam and the crystalline sample. In addition, an image processor is provided for processing images from electrons from the crystalline sample and a controller for controlling the scanning actuator to space points on the crystalline sample, at which the electron beam is directed. The points are preferably spaced apart a distance that is at least as large as a known grain size of the crystalline sample. The controller determines a grain orientation with respect to each point within a series of points within a scan area of the crystalline sample. The controller determines an average grain orientation for the crystalline sample for current image and a previously processed image. The controller monitors a variance in the average deviation and terminates the scanning when the variance in the average grain orientation approaches a predetermined value.