Thomas J Dey

US Patent:

7336370, Feb 26, 2008

Filed:

Nov 7, 2005

Appl. No.:

11/268014

Inventors:

Eugene Olczak - Pittsford NY, US
John J. Hannon - Rochester NY, US
Thomas W. Dey - Springwater NY, US
Arthur E. Jensen - Rochester NY, US

Assignee:

ITT Manufacturing Enterprises, Inc. - Wilmington DE

International Classification:

G01B 9/02

US Classification:

356512, 356124

Abstract:

An optical nulling apparatus for testing an optical surface includes an aspheric mirror having a reflecting surface for imaging light near or onto the optical surface under test, where the aspheric mirror is configured to reduce spherical aberration of the optical surface under test. The apparatus includes a light source for emitting light toward the aspheric mirror, the light source longitudinally aligned with the aspheric mirror and the optical surface under test. The aspheric mirror is disposed between the light source and the optical surface under test, and the emitted light is reflected off the reflecting surface of the aspheric mirror and imaged near or onto the optical surface under test. An optical measuring device is disposed between the light source and the aspheric mirror, where light reflected from the optical surface under test enters the optical measuring device. An imaging mirror is disposed longitudinally between the light source and the aspheric mirror, and the imaging mirror is configured to again reflect light, which is first reflected from the reflecting surface of the aspheric mirror, onto the optical surface under test.

US Patent:

7764385, Jul 27, 2010

Filed:

Aug 21, 2007

Appl. No.:

11/894437

Inventors:

Thomas William Dey - Springwater NY, US

Assignee:

ITT Manufacturing Enterprises, Inc. - Wilmington DE

International Classification:

G01B 11/02
G01N 21/45

US Classification:

356518, 356508

Abstract:

A system for aligning a segmented mirror includes a source of radiation directed along a first axis to the segmented mirror and a beamsplitter removably inserted along the first axis for redirecting radiation from the first axis to a second axis, substantially perpendicular to the first axis. An imaging array is positioned along the second axis for imaging the redirected radiation, and a knife-edge configured for cutting the redirected radiation is serially positioned to occlude and not occlude the redirected radiation, effectively providing a variable radiation pattern detected by the imaging array for aligning the segmented mirror.

US Patent:

8269982, Sep 18, 2012

Filed:

Mar 10, 2010

Appl. No.:

12/721009

Inventors:

Gene Olczak - Pittsford NY, US
Stephen D O'Donohue - Rochester NY, US
Thomas W Dey - Springwater NY, US
Cormic K Merle - Rochester NY, US

Assignee:

Exelis, Inc. - McClean VA

International Classification:

G01B 11/02

US Classification:

356513

Abstract:

A system for measuring deformation of at least one surface of an object including an interferometer for receiving illumination reflected from the surface of the object, and a surface treatment disposed on the surface of the object for providing a retro-reflective patina. The retro-reflective patina is configured to reflect the illumination from the surface of the object. The retro-reflective patina is attached to the surface of the object and may include a plurality of cube corners, or a plurality of dielectric spheres, or a combination of cube corners and dielectric spheres. Impinging light onto the object is provided by an optical source that may be separate from or integral to the interferometer. The impinging light may be directed toward the object through an objective lens, which is also used for receiving the illumination from the object. Alternatively, the impinging light may be directed toward the object by first bypassing the objective lens.

US Patent:

51173050, May 26, 1992

Filed:

Jul 25, 1990

Appl. No.:

7/557891

Inventors:

Thomas W. Dey - Springwater NY

Assignee:

Eastman Kodak Company - Rochester NY

International Classification:

G02B 5122

US Classification:

359529

Abstract:

A novel optical device, comprising, in one embodiment, a modified corner cube retroreflector. A conventional corner cube retroreflector may be modified so that a face plate comprises an enhanced reflectivity coating. The novel device functions such that at least five percent of the energy of a radiation beam incident to the device, may be reflected at the face plate in accordance with Snell's Law. It is disclosed that the novel device may be advantageously employed in a novel optical alignment assembly.

US Patent:

40741265, Feb 14, 1978

Filed:

Nov 17, 1975

Appl. No.:

5/632611

Inventors:

Thomas W. Dey - Rochester NY

Assignee:

Bausch & Lomb Incorporated - Rochester NY

International Classification:

F21V 500

US Classification:

362297

Abstract:

A lighting panel used to control locally unidirectional light is constructed from a plurality of light modifying elements that substantially control the distribution of light within a control range. Each element is disposed in the panel to receive the unidirectional light and has a surface configuration for critically reflecting the received light and for refracting the initially reflected light upon leaving the elements into the control range.

US Patent:

40717488, Jan 31, 1978

Filed:

Mar 29, 1976

Appl. No.:

5/671900

Inventors:

Thomas W. Dey - Rochester NY

Assignee:

Bausch & Lomb Incorporated - Rochester NY

International Classification:

F21V 914
F21V 500

US Classification:

362 19

Abstract:

A lighting panel used to control locally unidirectional light is constructed from a plurality of light modifying elements that substantially control the distribution of light within a control range. Each element is disposed in the panel to receive the unidirectional light and has a surface means for critically reflecting the received light and for refracting the initially reflected light upon leaving the elements into the control range.

US Patent:

50838660, Jan 28, 1992

Filed:

Jul 25, 1990

Appl. No.:

7/558032

Inventors:

Thomas W. Dey - Springwater NY

Assignee:

Eastman Kodak Company - Rochester NY

International Classification:

G01B 902

US Classification:

356363

Abstract:

A method for monitoring an alignment of a workpiece with respect to a reference. The method includes a step of attaching to the workpiece a novel optical device comprising a modified corner cube retroreflector. The novel optical device can function such that a specified percentage of incident radiation reflects in accordance with Snell's Law, with a residual reflected beam reflecting retroreflectively. The method further includes a step of directing a radiation beam to the optical device, for generating an interference pattern induced by the Snell's Law and retroreflective beams. The interference pattern provides a measure of the alignment of the workpiece.

US Patent:

58352678, Nov 10, 1998

Filed:

Jul 15, 1997

Appl. No.:

8/893943

Inventors:

Kenneth L. Mason - Pittsford NY
Thomas W. Dey - Springwater NY

Assignee:

Eastman Kodak Company - Rochester NY

International Classification:

G02B 2300

US Classification:

359399

Abstract:

Apparatus and method for radiometrically calibrating an imaging sensor array using the sun as a calibration light source in an optical system of the type having an accessible real conjugate of the entrance pupil, includes a flux concentrator for concentrating the sunlight. A flux modulator modulates the intensity of the concentrated sunlight and a flux relay for relaying the intensity modulated sunlight to the real conjugate of the entrance pupil of the optical system. A flux diffuser located at the real conjugate of the entrance pupil of the optical system illuminates the imaging sensor array with diffuse intensity modulated sunlight for calibrating the imaging sensor. A radiometric calibration assembly is proposed to calibrate an imaging sensor array of an earth imaging system. The calibration assembly comprises a flux concentrator, a flux modulator, a flux relay lens and a flux diffuser located within a conjugate pupil of the earth imaging system. The flux concentrator transfers solar flux to the flux modulator, which modulates the flux to a number of controlled, deterministic levels.