Thomas K Leddy

US Patent:

8530851, Sep 10, 2013

Filed:

Dec 21, 2012

Appl. No.:

13/723269

Inventors:

Eli Levi - Dix Hills NY, US
Thomas Leddy - Eastport NY, US

Assignee:

ATTI International Services Company, Inc. - Hauppauge NY

International Classification:

H01J 3/14

US Classification:

250397

Abstract:

Electron beam profile testing and analysis method is introduced using the MOMS apparatus. The MOMS apparatus includes a Faraday Cup with a knife-wires scanning system which together perform simultaneous measurements. The scanning system has a five-dimensional processing mechanism for measuring different cross sections of an e-beam profile in a path of the e-beam. Measurements are conducted using the scanning system by virtually dividing each cross section into a plurality of subsections and measuring independent current values of at least one wire of the scanning system through which the electron beam passes from every pixel in each of the plurality of subsections. By providing relative movement between the scanning system and e-beam, the measured independent current values are analyzed to obtain the functional form of distribution of current density of the cross-section of the e-beam. The Faraday cup enables simultaneous measurement of the total value of the current.