Thomas W Morrison

US Patent:

6753688, Jun 22, 2004

Filed:

Apr 10, 2001

Appl. No.:

09/829749

Inventors:

Roger M. Eddy - Wappingers Falls NY
Charles J. Hendricks - Wappingers Falls NY
Thomas Morrison - Pleasant Valley NY
Robert N. Wiggin - Poughkeepsie NY
Brian J. Wojszynski - Hyde Park NY

Assignee:

International Business Machines Corporation - Armonk NY

International Classification:

G01R 3102

US Classification:

324550, 324523, 324555

Abstract:

A method and structure for an electronic circuit test and repair apparatus includes both of at least one wiring analyzer to locate circuit shorts and a current source to provide current sufficient to attempt to remove any identified shorts.

US Patent:

60053860, Dec 21, 1999

Filed:

Apr 17, 1997

Appl. No.:

8/840835

Inventors:

Robert H. Cadwallader - Clinton Corners NY
Thomas Morrison - Pleasant Valley NY
Klaus Probst - Herrenberg, DE
Brian J. Wojszynski - Hyde Park NY
William A. Yager - Salt Point NY

Assignee:

International Business Machines Corporation - Armonk NY

International Classification:

G01R 104
G01R 3102

US Classification:

3241581

Abstract:

An apparatus for locating a workpiece on a processing surface includes a first locator arm assembly, a second locator arm assembly, and a pivotal member. The first locator arm assembly includes a first multiple position locator jaw disposed for lateral movement and mating engagement with a first portion of the workpiece. The second locator arm assembly includes a second multiple position locator jaw disposed for lateral movement parallel to the first multiple position locator jaw and further for mating engagement with a second, opposite side, portion of the workpiece. Lastly, the pivotal member is disposed for pivotal movement about a pivot point. The pivotal member is symmetrically coupled between the first locator arm assembly and the second locator arm assembly for inducing an equal but opposite lateral movement in the first and second locator jaws to accurately locate the workpiece on the processing surface between the first and second locator jaws as the locator jaws move towards one another.

US Patent:

60585927, May 9, 2000

Filed:

May 28, 1998

Appl. No.:

9/086046

Inventors:

Robert H. Cadwallader - Clinton Corners NY
Michael J. Fisher - Poughkeepsie NY
Thomas Morrison - Pleasant Valley NY

Assignee:

International Business Machines Corporation - Armonk NY

International Classification:

B23Q 308

US Classification:

29559

Abstract:

An apparatus for locating a workpiece on a processing surface includes a first locator arm assembly, a second locator arm assembly, and a pivotal member. The first locator arm assembly includes a first surface disposed for lateral movement and mating engagement with a first portion of the workpiece. The second locator arm assembly includes a second surface disposed for lateral movement parallel to the first surface, the second surface further for mating engagement with a second, opposite side, portion of the workpiece. Lastly, pivotal member is disposed for pivotal movement about a pivot point and symmetrically coupled, with a zero tolerance buildup, between the first locator arm assembly and the second locator arm assembly for inducing an equal but opposite lateral movement in the first and second mating engagement surfaces of the first and second locator arm assemblies, respectively, whereby the workpiece is accurately located on the processing surface between respective first and second mating engagement surfaces as the surfaces are moved towards one another.

US Patent:

58735666, Feb 23, 1999

Filed:

Apr 17, 1997

Appl. No.:

8/840833

Inventors:

Robert H. Cadwallader - Clinton Corners NY
Michael J. Fisher - Poughkeepsie NY
Thomas Morrison - Pleasant Valley NY

Assignee:

International Business Machines Corporation - Armonk NY

International Classification:

B23Q 308

US Classification:

269 34

Abstract:

An apparatus for locating a workpiece on a processing surface includes a first locator arm assembly, a second locator arm assembly, and a pivotal member. The first locator arm assembly includes a first surface disposed for lateral movement and mating engagement with a first portion of the workpiece. The second locator arm assembly includes a second surface disposed for lateral movement parallel to the first surface, the second surface further for mating engagement with a second, opposite side, portion of the workpiece. Lastly, pivotal member is disposed for pivotal movement about a pivot point and symmetrically coupled, with a zero tolerance buildup, between the first locator arm assembly and the second locator arm assembly for inducing an equal but opposite lateral movement in the first and second mating engagement surfaces of the first and second locator arm assemblies, respectively, whereby the workpiece is accurately located on the processing surface between respective first and second mating engagement surfaces as the surfaces are moved towards one another.

US Patent:

59173297, Jun 29, 1999

Filed:

Apr 17, 1997

Appl. No.:

8/840836

Inventors:

Robert H. Cadwallader - Clinton Corners NY
Thomas Morrison - Pleasant Valley NY
Klaus Probst - Herrenberg, DE
Brian J. Wojszynski - Hyde Park NY
William A. Yager - Salt Point NY

Assignee:

International Business Machines Corporation - Armonk NY

International Classification:

G01R 3102

US Classification:

324754

Abstract:

An electrical contacting apparatus for testing a substrate (54) and having a principal axis includes an electrical contact pad, a guide plate (106), a supporting bridge (132), and a mechanism for providing a contact actuation force. The guide plate includes side edges with guide pins (108) extending radially outward from a center of each side edge. The electrical contact pad (114) is mounted and centered upon a top surface of the guide plate (106). The support bridge supports the guide plate to enable a pivotal movement of the guide plate about a point on the principal axis. Lastly, the contact actuation force mechanism provides a contact actuation force to a center of the bottom surface of the guide plate to maintain an equal force across the electrical contact pad in a direction of the principal axis, whereby the electrical contact pad provides a desired contacting force equally balanced across an entire contact area defined by an area of contact between the electrical contact pad and a substrate being contacted. The substrate (54) is to be clamped between test probes (52) and the contact pad (114).

US Patent:

60548630, Apr 25, 2000

Filed:

Sep 11, 1996

Appl. No.:

8/710130

Inventors:

Thomas Morrison - Pleasant Valley NY
Siegfried Geyer - Nufringen, DE
Charles J. Hendricks - Wappingers Falls NY
Klaus Probst - Herrenberg, DE

Assignee:

International Business Machines Corporation - Armonk NY

International Classification:

G01R 3102
H01H 3102

US Classification:

324537

Abstract:

A system for testing circuit boards comprising a probe network having a plurality of probes wherein each probe is adapted for contacting an end of a corresponding circuit board network and wherein each probe and network define a node having an address. The system further comprises a control device that includes a node address generator and a timing circuit having an output for outputting a pulse to the node having the address generated by the node address generator and for coupling the remaining nodes to electrical ground. The system further comprises a comparator for comparing the pulse outputted by the timing circuit to predetermined data.

US Patent:

60436670, Mar 28, 2000

Filed:

Apr 17, 1997

Appl. No.:

8/840834

Inventors:

Robert H. Cadwallader - Clinton Corners NY
Thomas Morrison - Pleasant Valley NY
Klaus Probst - Herrenberg, DE
William A. Yager - Salt Point NY

Assignee:

International Business Machines Corporation - Armonk NY

International Classification:

G01R 1302

US Classification:

324758

Abstract:

A substrate tester and method of testing are disclosed in which the tester moves a substrate to be tested into a precise location within the tester prior to making contact with fragile tester pins. The substrate is then clamped in a precise X-Y location relative to the tester contact pins, also without making contact with the tester pins. Next the substrate top surface is moved quickly to a precise Z-axis location, whereupon the tester contact pins are finally applied to the substrate using Z-axis motion only. In addition, a mechanism is included that features a cam-pivot arm micro-switch combination to sense when a product is not properly positioned in or missing from the test station.

US Patent:

52219054, Jun 22, 1993

Filed:

Feb 28, 1992

Appl. No.:

7/843050

Inventors:

Labh S. Bhangu - Hopewell Junction NY
Thomas Morrison - Pleasant Valley NY
Klaus Probst - Herrenberg, DE

Assignee:

International Business Machines Corporation - Armonk NY

International Classification:

G01R 2714
G01R 3104

US Classification:

324713

Abstract:

An improved test system includes means for generating a contact wetting pulse and applying the contact wetting pulse to a network such that contact resistance at the interfaces between probes of the test system and terminals of the network is effectively lowered.