Tracy E Myers

US Patent:

6817004, Nov 9, 2004

Filed:

Jan 22, 2003

Appl. No.:

10/349564

Inventors:

Joseph W. Cowan - West Linn OR
Jeffrey E. Blackwood - Portland OR
Tracy D. Myers - Clackamas OR

Assignee:

LSI Logic Corporation - Milpitas CA

International Classification:

G06F 1750

US Classification:

716 11, 716 8

Abstract:

A method of displaying a net in a CAD layout for an integrated circuit chip includes steps for receiving a netlist of an integrated circuit design, displaying a CAD layout of the netlist, selecting a net segment in the CAD layout, and displaying a physical characteristics list of information items representative of physical characteristics of the net segment.

US Patent:

6951000, Sep 27, 2005

Filed:

Jan 22, 2003

Appl. No.:

10/349770

Inventors:

Joseph Cowan - West Linn OR, US
Tracy Myers - Clackamas OR, US

Assignee:

LSI Logic Corporation - Milpitas CA

International Classification:

G06F017/50

US Classification:

716 4, 716 5

Abstract:

A method of generating a simulated voltage contrast image includes steps for receiving as input design information for an integrated circuit die, selecting a net of the integrated circuit from the design information, generating a trace outline of the selected net from the image, analyzing the design information to calculate an interaction between a charged particle beam and the selected net, selecting a shading representative of the calculated interaction, and filling the trace outline of the selected net with the shading to generate the simulated voltage contrast image.

US Patent:

7245758, Jul 17, 2007

Filed:

Aug 20, 2003

Appl. No.:

10/644116

Inventors:

Jeffrey Blackwood - Portland OR, US
Tracy Myers - Clackamas OR, US

Assignee:

LSI Corporation - Milpitas CA

International Classification:

G06K 9/00

US Classification:

382145

Abstract:

A method and system for collecting and analyzing photoemission data wherein illumination and photoemission images are acquired for a plurality of die, such as for each die on a wafer. Then, the images are overlaid, aligned, and assembled in a mosaic, thereby allowing analysis of the photoemission occurring across a plurality of die, such as across the entire wafer. Preferably, gathering this data allows statistical analysis of the photoemission such as analysis of commonly emitting locations to identify structures/cells that are sensitive to the manufacturing process.

US Patent:

7429733, Sep 30, 2008

Filed:

Dec 29, 2005

Appl. No.:

11/323405

Inventors:

Michael B. Schmidt - Gresham OR, US
Tracy D. Myers - Clackamas OR, US

Assignee:

LSI Corporation - Milpitas CA

International Classification:

H01J 37/28

US Classification:

250311, 250306, 250307, 250308, 25049221, 2504911, 216 39, 438460

Abstract:

A method and sample for radiation microscopy include a sample source that includes an area of interest, an outer side of a sample formed in the sample source adjacent to the area of interest, an inner side of the sample formed inside the sample source wherein at least a portion of the area of interest is included between the inner side of the sample and the outer side, and a particle beam channel formed inside the sample source for conducting a particle beam to or from the inner side of the sample.

US Patent:

20040032271, Feb 19, 2004

Filed:

Aug 19, 2002

Appl. No.:

10/223412

Inventors:

Jeffrey Blackwood - Portland OR, US
Tracy Myers - Clackamas OR, US

International Classification:

G01R031/02

US Classification:

324/754000

Abstract:

A contactor for providing electrical connections between a device under test and a tester input board. The device under test has first electrical contacts with a first pitch and a first diameter that contact a first side of the contactor, and the tester input board has second electrical contacts with a second pitch and a second diameter that contact a second side of the contactor. The contactor has a sheet of an electrically insulating material with a first surface at the first side of the contactor and a second surface at the second side of the contactor. The first surface and the second surface of the electrically insulating material are substantially parallel one to another. Electrical connectors extend along a length from the first side of the contactor to the second side of the contactor. The electrical connectors are substantially parallel one to another along their lengths. The electrical connectors have a third diameter that is no greater than the first pitch and the second pitch, and also have a third pitch that is no greater than the first pitch and the second pitch.