Walter L Bloss from 27930 Beechgate Dr, Palos Verdes Estates, CA 90275, age 74, Phone: 3103772563

Heptagonal Antenna Array
view source
US Patent:

8314748, Nov 20, 2012
Filed:

Mar 9, 2010
Appl. No.:

12/720659
Inventors:

David A. Ksienski - Los Angeles CA, US
Walter L. Bloss - Rancho Palos Verdes CA, US
James P. McKay - Hermosa Beach CA, US
Assignee:

The Aerospace Corporation - El Segundo CA
International Classification:

H01Q 21/00
US Classification:

343844, 343705, 343853, 2441726
Abstract:

An antenna system includes a heptagonal antenna array having one center antenna element and seven circumferentially surrounding antenna elements offering improved near and far sidelobe rejection, which is well suited for mechanically-gimbaled and time delayed electrical steering antenna applications.

Heptagonal Antenna Array System
view source
US Patent:

20090002249, Jan 1, 2009
Filed:

Jun 26, 2007
Appl. No.:

11/821931
Inventors:

Walter L. Bloss - Rancho Palos Verdes CA, US
David A. Ksienski - Los Angeles CA, US
James P. McKay - Hermosa Beach CA, US
International Classification:

H01Q 3/02
H01Q 13/02
H01Q 21/00
US Classification:

343758, 343781 R, 343824
Abstract:

An antenna system includes a heptagonal antenna array having one center antenna element and seven circumferentially surrounding antenna elements offering improved near and far sidelobe rejection, which is well suited for mechanically-gimbaled and time delayed electrical steering antenna applications.

Radiation Hard Gaas High Electron Mobility Transistor
view source
US Patent:

50289683, Jul 2, 1991
Filed:

Jan 2, 1990
Appl. No.:

7/460206
Inventors:

Michael J. O'Loughlin - Irvine CA
Richard J. Krantz - Torrance CA
Walter L. Bloss - Rancho Palos Verdes CA
Assignee:

The Aerospace Corporation - El Segundo CA
International Classification:

H01L 29161
US Classification:

357 16
Abstract:

The incorporation of a GaAs layer that is intentionally p-doped into a standard HEMT device structure has been shown to produce a HEMT transistor with greatly enhanced radiation hardness under exposure to neutron radiation.