Walter L Cook

US Patent:

7518118, Apr 14, 2009

Filed:

Feb 26, 2008

Appl. No.:

12/037889

Inventors:

Fiona A. Harrison - Los Angeles CA, US
Walter Cook - Long Beach CA, US

Assignee:

California Institute of Technology - Pasadena CA

International Classification:

G01T 1/24

US Classification:

250371, 2503701

Abstract:

Interaction depth of photons in a CdZnTe pixel detector is measured by configuring an ASIC connected to the detector to measure both positive polarity and negative polarity signal amplitudes and then measuring a core pixel having positive signal amplitude and hallow pixels having negative signal amplitude and surrounding the core pixel.

US Patent:

20050167606, Aug 4, 2005

Filed:

Aug 20, 2004

Appl. No.:

10/923249

Inventors:

Fiona Harrison - Los Angeles CA, US
Walter Cook - Long Beach CA, US
Chi Ming Chen - Monterey Park CA, US
Branislav Kecman - Pasadena CA, US
Peter Mao - Los Angeles CA, US
Stephen Schindler - Big Sur CA, US
Jill Bumham - Pasadena CA, US

International Classification:

G01T001/24

US Classification:

250370130, 250395000

Abstract:

The present invention relates to cadmium-zinc-telluride (CdZnTe) detectors. More specifically, the present invention relates CdZnTe pixel detectors that are optimized for astrophysical applications.

US Patent:

20060043315, Mar 2, 2006

Filed:

Aug 19, 2005

Appl. No.:

11/207504

Inventors:

Walter Cook - Long Beach CA, US
Jill Bumham - Pasadena CA, US

International Classification:

B01D 59/44

US Classification:

250489000

Abstract:

The present invention relates to a detector system. More specifically, the present invention relates to a detector system that comprises an ionizing radiation detector; a very large-scale integration (VLSI) circuit bonded with the ionizing radiation detector for receiving a signal from the ionizing radiation detector; and a microprocessor connected with the VSLI circuit for operating the VLSI circuit. Signals are received by the ionizing radiation detector, passed through the VLSI circuit, and processed by the microprocessor. The VLSI circuit includes a plurality of readout channels. Each readout channel includes a pre-amplifier; a plurality of sampling capacitors; a shaping amplifier; a discriminator; and a latch.

US Patent:

54413443, Aug 15, 1995

Filed:

Oct 22, 1993

Appl. No.:

8/139830

Inventors:

Walter R. Cook - Long Beach CA

International Classification:

G01K 102
G01K 114
G01K 708
G01K 1300

US Classification:

374141

Abstract:

Measurement and display of the temperature of a cooking surface of a cooking utensil is provided by a temperature sensor, such as a thermocouple, in thermal contact either directly with the cooking surface or through a clamp on the side of the cooking utensil in close proximity to the cooking surface, and a temperature measuring and display electrically connected to the sensor at a location on the handle of the cooking utensil or on the upper end of the clamp for convenient viewing of the temperature of the cooking surface at a location away from the temperature sensor.

US Patent:

56202555, Apr 15, 1997

Filed:

Aug 2, 1995

Appl. No.:

8/510240

Inventors:

Walter R. Cook - Long Beach CA

International Classification:

G01K 102
G01K 114
G01K 1300
G01K 704

US Classification:

374141

Abstract:

Measurement and display of the temperature of a cooking surface of a cooking utensil is provided by a temperature sensor, such as a thermocouple in thermal contact either directly with the cooking surface or through a clamp on the side of the cooking utensil in close proximity to the cooking surface, and a temperature measuring and display electrically connected to the temperature sensor and located on the handle of the cooking utensil or on the upper end of the clamp for convenient viewing of the temperature of the cooking surface at a location away from the temperature sensor.