Wanda L Key

US Patent:

20070006161, Jan 4, 2007

Filed:

Jun 2, 2006

Appl. No.:

11/445201

Inventors:

Anthony Kuester - Vienna VA, US
Wanda Key - Haymarket VA, US
Lillian Zelinski - Alexandria VA, US

International Classification:

G06F 9/44

US Classification:

717126000, 717121000, 717100000

Abstract:

A method for evaluating the compliance of software to a standard quality process includes establishing a standard quality process that includes a plurality of stages, each of the plurality of stages corresponding to a software development process. A plurality of objective qualifiers associated with the standard quality process are defined, and a weighting factor is assigned to each of the plurality of objective qualifiers. The method also includes applying each of the plurality of objective qualifiers to a software application, and determining a field worthiness score corresponding to the correlation of the software application with each of the objective qualifiers.

US Patent:

20200200589, Jun 25, 2020

Filed:

Mar 6, 2020

Appl. No.:

16/811552

Inventors:

- Washington DC, US
Wanda L. Key - Gainesville VA, US

International Classification:

G01G 19/52
G01B 5/00
G01B 11/02

Abstract:

A multi-dimensional measuring system is disclosed. The measuring system includes a dimensional measuring device that fits over an exterior portion of an item and provides reference measurements in three orthogonal directions. The measuring system also includes a camera to take an image of the item with the dimensional measuring placed thereon and a hardware processor that receives and processes the image to determine the dimensions of the item based upon the reference measurements of the dimensional measuring device.

US Patent:

20190170568, Jun 6, 2019

Filed:

Feb 4, 2019

Appl. No.:

16/266904

Inventors:

- Washington DC, US
Wanda L. Key - Gainesville VA, US

International Classification:

G01G 19/52
G01B 5/00
G01B 11/02

Abstract:

A multi-dimensional measuring system is disclosed. The measuring system includes a dimensional measuring device that fits over an exterior portion of an item and provides reference measurements in three orthogonal directions. The measuring system also includes a camera to take an image of the item with the dimensional measuring placed thereon and a hardware processor that receives and processes the image to determine the dimensions of the item based upon the reference measurements of the dimensional measuring device.

US Patent:

20160363990, Dec 15, 2016

Filed:

Jun 9, 2016

Appl. No.:

15/178040

Inventors:

- Washington DC, US
Wanda L. Key - Gainesville VA, US

International Classification:

G06F 3/00
G01G 19/52

Abstract:

A multi-dimensional measuring system is disclosed. The measuring system includes a dimensional measuring device that fits over an exterior portion of an item and provides reference measurements in three orthogonal directions. The measuring system also includes a camera to take an image of the item with the dimensional measuring placed thereon and a hardware processor that receives and processes the image to determine the dimensions of the item based upon the reference measurements of the dimensional measuring device.