Warren M Pfeffer

US Patent:

20090281770, Nov 12, 2009

Filed:

May 9, 2008

Appl. No.:

12/117966

Inventors:

Steven W. Yatko - Upper Saddle River NJ, US
Warren M. Pfeffer - Princeton NJ, US
Killian D. Murphy - Brooklyn NY, US

International Classification:

G06F 15/00

US Classification:

702186

Abstract:

Pursuant to some embodiments, a platform matching system, method, apparatus and means are provided which include identifying at least a first benchmark test procedure to evaluate at least a first and a second target platform for use with an application, the at least first benchmark test procedure including at least a first unit test; receiving test result data from tests performed on the at least first and second target platform using the at least first benchmark test procedure; and performing a matching analysis to determine which of the at least first and second target platform is a best fit for the application.

US Patent:

20130124145, May 16, 2013

Filed:

Jun 19, 2012

Appl. No.:

13/526703

Inventors:

Steven W. Yatko - Upper Saddle River NJ, US
Warren M. Pfeffer - Princeton NJ, US
Killian D. Murphy - Brooklyn NY, US

International Classification:

G06F 11/30

US Classification:

702186

Abstract:

Pursuant to some embodiments, a platform matching system, method, apparatus and means are provided which include identifying at least a first benchmark test procedure to evaluate at least a first and a second target platform for use with an application, the at least first benchmark test procedure including at least a first unit test; receiving test result data from tests performed on the at least first and second target platform using the at least first benchmark test procedure; and performing a matching analysis to determine which of the at least first and second target platform is a best fit for the application.