William J Darby

US Patent:

7876276, Jan 25, 2011

Filed:

Aug 2, 2006

Appl. No.:

11/499982

Inventors:

Afroz J. Zaman - Strongsville OH, US
Richard Q. Lee - Ann Arbor MI, US
William G. Darby - Litchfield OH, US
Philip J. Barr - Schiller Park IL, US
Kevin M Lambert - North Royalton OH, US
Felix A. Miranda - Olmsted Falls OH, US

Assignee:

The United States of America as represented by the Administrator of the National Aeronautics and Space Administration - Washington DC

International Classification:

G01R 29/10

US Classification:

343703

Abstract:

A miniaturized antenna system is characterized non-destructively through the use of a scanner that measures its near-field radiated power performance. When taking measurements, the scanner can be moved linearly along the x, y and z axis, as well as rotationally relative to the antenna. The data obtained from the characterization are processed to determine the far-field properties of the system and to optimize the system. Each antenna is excited using a probe station system while a scanning probe scans the space above the antenna to measure the near field signals. Upon completion of the scan, the near-field patterns are transformed into far-field patterns. Along with taking data, this system also allows for extensive graphing and analysis of both the near-field and far-field data. The details of the probe station as well as the procedures for setting up a test, conducting a test, and analyzing the resulting data are also described.

US Patent:

20110032253, Feb 10, 2011

Filed:

Aug 16, 2010

Appl. No.:

12/857004

Inventors:

Afroz J. Zaman - Strongsville OH, US
Richard Q. Lee - Ann Arbor MI, US
William G. Darby - Litchfield OH, US
Philip J. Barr - Schiller Park IL, US
Kevin M. Lambert - North Royalton OH, US
Felix A. Miranda - Olmsted Falls OH, US

International Classification:

G06T 17/00

US Classification:

345419

Abstract:

A miniaturized antenna system is characterized non-destructively through the use of a scanner that measures its near-field radiated power performance. When taking measurements, the scanner can be moved linearly along the x, y and z axis, as well as rotationally relative to the antenna. The data obtained from the characterization are processed to determine the far-field properties of the system and to optimize the system. Each antenna is excited using a probe station system while a scanning probe scans the space above the antenna to measure the near field signals. Upon completion of the scan, the near-field patterns are transformed into far-field patterns. Along with taking data, this system also allows for extensive graphing and analysis of both the near-field and far-field data. The details of the probe station as well as the procedures for setting up a test, conducting a test, and analyzing the resulting data are also described.