William V Waters

US Patent:

56315716, May 20, 1997

Filed:

Apr 3, 1996

Appl. No.:

8/626870

Inventors:

Stephen Spaziani - Nashua NH
Kenneth Vaccaro - Acton MA
William Waters - Bedford MA

Assignee:

The United States of America as represented by the Secretary of the Air
Force - Washington DC

International Classification:

G01R 3128
G01R 3126
G01R 1900

US Classification:

324752

Abstract:

A system for functionally testing opto-electronic devices, such as fiber-optic infrared receiver photodiodes, in the integral wafer or other optical port-exposed status. The testing arrangement uses a portable optical probe for communicating optical signals between the testing apparatus and the tested device in coincidence with electrical energization and functional operation of the electro-optical device by the test apparatus. The optical probe signals may be correlated in time relationship or other manner with the electrical signals applied-to the device-under-test. The invention provides simple conversion between a conventional electrical semiconductor device probe station and an electro-optical device probe station.