Skills:
Focused Ion Beam (FIB), Cathodoluminescence (CL), Photoluminescence (PL), X-Ray Diffractometry (XRD), X-ray Reflectivity (XRR), Scanning Electron Microscopy (SEM), Energy-dispersive X-ray Spectroscopy (EDX), Atomic Force Microscopy (AFM), Rutherford Backscattering Spectroscopy (RBS), Transmission Electron Microscopy (TEM), Tunable diode laser, Polarization controller, Optical Spectrum Analyzer (OSA), Optical beam profiler, Power meter, Multiple back-reflection meter, Fiber microscope, Ion milling etching, Metal deposition (Sputtering, e-beam evaporation, ion-beam evaporation), Photolithography, Film deposition (PVD). I-V, C-V, Hall measurement, WaveMetrics Igor Pro, OriginLab Origin, FEI Avizo Fire, Matlab, Mathematica, C/C++, Solidworks, CorelDraw, Zemax OpticStudio, Bruker Espirit Quantax 400, Panalytical Xpert Suite, Microsoft Office suite.