Yun-Ho Wu

US Patent:

8522090, Aug 27, 2013

Filed:

May 24, 2011

Appl. No.:

13/114981

Inventors:

Jitendra Kumar Swarnkar - Sunnyvale CA, US
Vincent Wong - Fremont CA, US
Yun-Ho Wu - Milpitas CA, US
Rakeshkumar K. Patel - Sunnyvale CA, US

Assignee:

Marvell International Ltd. - Hamilton

International Classification:

G11C 29/00

US Classification:

714718

Abstract:

A method of testing a double data rate (DDR) memory interface within a System-on-chip (SoC). The method comprises generating a data stream within the SoC and writing the data stream to an internal memory within the SoC via the DDR memory interface. The method further comprises reading the data stream from the internal memory within the SoC and comparing the data stream generated within the SoC with the data stream read from the internal memory within the SoC.