Jonathan C Li

US Patent:

7440862, Oct 21, 2008

Filed:

May 10, 2004

Appl. No.:

10/842290

Inventors:

Jonathan Qiang Li - Mountain View CA, US
Daniel A. Usikov - Newark CA, US

Assignee:

Agilent Technologies, Inc. - Santa Clara CA

International Classification:

G06F 11/00
G06F 17/00

US Classification:

702108, 702181

Abstract:

Embodiments of the present invention use the results of a plurality of defect detecting tests and adjust the result of each test in a manner that reflects the accuracy of the test that produced it. A manufactured unit can then be evaluated using a mathematical combination of the adjusted results.

US Patent:

7869647, Jan 11, 2011

Filed:

Apr 2, 2004

Appl. No.:

10/817660

Inventors:

Jonathan Qiang Li - Mountain View CA, US

Assignee:

Agilent Technologies, Inc. - Santa Clara CA

International Classification:

G06K 9/62
G06K 9/66
G06K 9/46

US Classification:

382159, 382190, 382225, 382228

Abstract:

Representative embodiments are directed to systems and methods for processing training data for a statistical classification application. In one embodiment, confidence values are calculated for training data elements to identify the probabilities of the training data elements belonging to identified classes. An interactive scatter plot is generated using the calculated confidence values. The scatter plot visually indicates the confidence values of points in the scatter plot. Accordingly, the user is able to identify potentially misclassified training data elements. The user may select training data elements from the scatter plot and reclassify training elements as appropriate. Upon reclassification, the confidence values may be recalculated and the scatter plot revised.

US Patent:

8438124, May 7, 2013

Filed:

Oct 18, 2007

Appl. No.:

11/874882

Inventors:

Nova Spivack - Tarrytown NY, US
Jonathan Qiang Li - San Francisco CA, US
Chris Jones - Mill Valley CA, US
Peter Royal - San Francisco CA, US
Lew Tucker - San Francisco CA, US
Scott White - Seattle WA, US
Jim Wissner - San Francisco CA, US

Assignee:

Evri Inc. - Seattle WA

International Classification:

G06F 17/00
G06N 5/00

US Classification:

706 45

Abstract:

Systems and methods of a knowledge management networking are disclosed here. In one aspect, embodiments of the present disclosure include a method, which may be implemented on a system, of hosting a web-space having a plurality of objects, the plurality of objects to include one or more of, representations of a set of users, a set of web-items, and a set of nets; wherein a net of the set of nets is a subset of the web-space comprising a sub-plurality of the plurality of objects. One embodiment can include, tracking an explicit relationship between a first set of at least two objects of the set of objects; the explicit relationship to be pre-determined by a user of the set of users, identifying an implicit relationship between a second set of at least two objects of the set of objects; the implicit relationship to be identified based on a semantic relationship between the at least two objects, and determining a default set of privacy rules governing access between the at least two objects based on one or more of the identified explicit relationship and the implicit relationship.

US Patent:

20030189904, Oct 9, 2003

Filed:

Apr 4, 2002

Appl. No.:

10/116429

Inventors:

Jonathan Li - Mountain View CA, US

International Classification:

G01R031/08
G06F011/00
G08C015/00

US Classification:

370/252000, 370/389000

Abstract:

A method and a system monitor fractal Internet Protocol traffic in a data network. The method determines a sampling interval and a sample size for sampling the data traffic such that the sampling has a predetermined response time and has a predetermined error tolerance that is bounded. The system employs the determined sampling interval and sample size for monitoring. The method comprises estimating a population variance from initial sampled data; estimating an index of self-similarity for the population; and computing the sampling interval and the sample size by simultaneously solving a pair of equations. The system comprises a probe that samples the traffic and generates sampled data; a processor, a memory, and a computer program stored in the memory and executed by the processor. The computer program comprises instructions that, when executed by the processor, determine the sampling interval and the sample size.

US Patent:

20030204507, Oct 30, 2003

Filed:

Apr 25, 2002

Appl. No.:

10/132626

Inventors:

Jonathan Li - Redwood City CA, US
David Smith - San Jose CA, US
Lee Barford - San Jose CA, US
John Heumann - Loveland CO, US

International Classification:

G06N005/00

US Classification:

707/100000

Abstract:

Hierarchical classification of samples. First stage classification identifies most members of the majority class and removes them from further consideration. Second stage classification then focuses on discriminating between the minority class and the greatly reduced number of majority class samples lying near the decision boundary.

US Patent:

20050097069, May 5, 2005

Filed:

Oct 31, 2003

Appl. No.:

10/699542

Inventors:

Jonathan Li - Mountain View CA, US
Lee Barford - San Jose CA, US

International Classification:

G06G007/00
G06F015/18
G06N005/02
G06F017/00

US Classification:

706046000, 706019000

Abstract:

Optimizing tester performance using Operating Characteristics curves. By modeling the Operating Characteristics of classifiers used in testing systems, tester performance is optimized. Classifiers are constructed using sample data. Operating Characteristic curves for each classifier are constructed, each Operating Characteristics curve representing a design alternative. The Operating Characteristic curves are combined with cost models from which design decisions may be made.

US Patent:

20050207655, Sep 22, 2005

Filed:

Mar 22, 2004

Appl. No.:

10/805748

Inventors:

Nasreen Chopra - Belmont CA, US
Jonathan Li - Mountain View CA, US
Izhak Baharav - San Jose CA, US

International Classification:

G06K009/68
G06K009/00

US Classification:

382218000

Abstract:

An inspection system inspects features of an object using a feedback mechanism. The inspection system includes a processor that receives image data representing the object. The processor is operable to determine parameter modification information from the image data and modify an image parameter used during the production of the image data with the parameter modification information. The modified image parameter is used during the production of subsequent image data representing the object.

US Patent:

20070168306, Jul 19, 2007

Filed:

Jan 17, 2006

Appl. No.:

11/334061

Inventors:

Jonathan Li - Mountain View CA, US
David Smith - San Jose CA, US

International Classification:

G06N 3/12
G06F 15/18

US Classification:

706013000

Abstract:

Individuals in a population are paired together to produce children. Each individual has a subset of features obtained from a group of features. A genetic algorithm is used to construct combinations or subsets of features in the children. A classification algorithm is then used to evaluate the fitness or cost value of each child. The processes of reproduction and evaluation repeat until the population reaches a given classification level. A different classification algorithm is then applied to the population that reached the given classification level.