Nikhil M Mehta

US Patent:

55938701, Jan 14, 1997

Filed:

Sep 14, 1994

Appl. No.:

8/305625

Inventors:

David E. Block - Lawrenceville NJ
Theron E. Hermann - Kinnelon NJ
Nikhil S. Mehta - Livingston NJ
Vishva R. Rai - Randolph NJ

Assignee:

Hoffmann-La Roche Inc. - Nutley NJ

International Classification:

C12P 1718

US Classification:

435119

Abstract:

The present invention is directed to a process for producing frenolicin B. The process comprises fermenting a broth so as to produce frenolicin, said broth having a microorganism capable of producing frenolicin. The frenolicin is then converted in the broth under anaerobic conditions to deoxyfrenolicin. The deoxyfrenolicin is converted to frenolicin B.

US Patent:

20220350260, Nov 3, 2022

Filed:

Sep 3, 2020

Appl. No.:

17/761475

Inventors:

- Veldhoven, NL
Nikhil MEHTA - Stamford CT, US
Patrick WARNAAR - Tilburg, NL
Vasco Tomas TENNER - Amsterdam, NL
Patricius Aloysius Jacobus TINNEMANS - Hapert, NL
Hugo Augustinus Joseph CRAMER - Eindhoven, NL

Assignee:

ASML Holding N.V. - Veldhoven
ASML Netherlands B.V. - Veldhoven

International Classification:

G03F 7/20
G01N 21/956
G01N 21/95

Abstract:

Disclosed is a method for a metrology measurement on an area of a substrate comprising at least a portion of a target structure. The method comprises receiving a radiation information representing a portion of radiation scattered by the are, and using a filter in a Fourier domain for removing or suppressing at least a portion of the received radiation information that does not relate to radiation that has been scattered by the target structure for obtaining a filtered radiation information for the metrology measurement, wherein characteristics of the filter are based on target information about the target structure.