Snigdha I Ghoshal

US Patent:

6652139, Nov 25, 2003

Filed:

Jan 21, 2003

Appl. No.:

10/348532

Inventors:

Steven Alan Cordes - Yorktown Heights NY
David R. DiMilia - Wappingers Falls NY
James Patrick Doyle - Bronx NY
Matthew James Farinelli - Bronx NY
Snigdha Ghoshal - Austin TX
Uttam Shyamalindu Ghoshal - Austin TX
Chandler Todd McDowell - Austin TX
Li Shi - Austin TX

Assignee:

International Business Machines Corporation - Armonk NY

International Classification:

G01K 1708

US Classification:

374208, 374 29, 374179

Abstract:

A method of fabricating a scanning heat flow probe for making quantitative measurements of heat flow through a device under test is provided. In one embodiment the scanning heat flow probe includes an electric current conductor in a cantilever beam connected to a probe tip and coupled to two voltmeter leads. The probe also includes two thermocouple junctions in the cantilever beam electrically isolated from the electric current conductor and the two voltmeter leads. Heat flow is derived quantitatively using only voltage and current measurements. The invention also relates to the calibration of scanning heat flow probes through a method involving interconnected probes, and relates to the minimization of heat flow measurement uncertainty by probe structure design practices.

US Patent:

6679625, Jan 20, 2004

Filed:

Dec 17, 2001

Appl. No.:

10/022162

Inventors:

Steven Alan Cordes - Yorktown Heights NY
David R. DiMilia - Wappingers Falls NY
James Patrick Doyle - Bronx NY
Matthew James Farinelli - Bronx NY
Snigdha Ghoshal - Austin TX
Uttam Shyamalindu Ghoshal - Austin TX
Chandler Todd McDowell - Austin TX
Li Shi - Austin TX

Assignee:

International Business Machines Corporation - Armonk NY

International Classification:

G01K 1700

US Classification:

374 29, 374113, 374 57, 374 43

Abstract:

A scanning heat flow probe for making quantitative measurements of heat flow through a device under test is provided. In one embodiment the scanning heat flow probe includes an electric current conductor in a cantilever beam connected to a probe tip and coupled to two voltmeter leads. The probe also includes two thermocouple junctions in the cantilever beam electrically isolated from the electric current conductor and the two voltmeter leads. Heat flow is derived quantitatively using only voltage and current measurements. In other forms, the invention relates to the calibration of scanning heat flow probes through a method involving interconnected probes, and relates to the minimization of heat flow measurement uncertainty by probe structure design practices.

US Patent:

6817761, Nov 16, 2004

Filed:

Apr 21, 2003

Appl. No.:

10/420063

Inventors:

Steven Alan Cordes - Yorktown Heights NY
David R. DiMilia - Wappingers Falls NY
James Patrick Doyle - Bronx NY
Matthew James Farinelli - Bronx NY
Snigdha Ghoshal - Austin TX
Uttam Shyamalindu Ghoshal - Austin TX
Chandler Todd McDowell - Austin TX
Li Shi - Austin TX

Assignee:

International Business Machines Corporation - Armonk NY

International Classification:

G01K 702

US Classification:

374179, 374 43, 374 44

Abstract:

A scanning heat flow probe for making quantitative measurements of heat flow through a device under test is provided. In one embodiment the scanning heat flow probe includes an electric current conductor in a cantilever beam connected to a probe tip and coupled to two voltmeter leads. The probe also includes two thermocouple junctions in the cantilever beam electrically isolated from the electric current conductor and the two voltmeter leads. Heat flow is derived quantitatively using only voltage and current measurements. In other forms, the invention relates to the calibration of scanning heat flow probes through a method involving interconnected probes, and relates to the minimization of heat flow measurement uncertainty by probe structure design practices.

US Patent:

6866415, Mar 15, 2005

Filed:

Jan 21, 2003

Appl. No.:

10/348541

Inventors:

Steven Alan Cordes - Yorktown Heights NY, US
David R. DiMilia - Wappingers Falls NY, US
James Patrick Doyle - Bronx NY, US
Matthew James Farinelli - Bronx NY, US
Snigdha Ghoshal - Austin TX, US
Uttam Shyamalindu Ghoshal - Austin TX, US
Chandler Todd McDowell - Austin TX, US
Li Shi - Austin TX, US

Assignee:

International Business Machines Corporation - Armonk NY

International Classification:

G01K017/00
G01K015/00

US Classification:

374 29, 374 1

Abstract:

A scanning heat flow probe for making quantitative measurements of heat flow through a device under test is provided. In one embodiment the scanning heat flow probe includes an electric current conductor in a cantilever beam connected to a probe tip and coupled to two voltmeter leads. The probe also includes two thermocouple junctions in the cantilever beam electrically isolated from the electric current conductor and the two voltmeter leads. Heat flow is derived quantitatively using only voltage and current measurements. In other forms, the invention relates to the calibration of scanning heat flow probes through a method involving interconnected probes, and relates to the minimization of heat flow measurement uncertainty by probe structure design practices.

US Patent:

61182842, Sep 12, 2000

Filed:

Oct 6, 1997

Appl. No.:

8/943218

Inventors:

Uttam S. Ghoshal - Austin TX
Snigdha Ghoshal - Austin TX

International Classification:

G01R 31315
G01R 3128

US Classification:

324750

Abstract:

A system for measuring magnetic fields produced by an integrated circuit device-under-test includes a clock generator configured to generate a clock signal, a delay circuit configured to generate a delayed clock signal having a known delay relative to the clock signal, a pulse generator configured to generate a series of pulses having a frequency corresponding to a frequency of the clock signal, the pulses of the series of pulses being offset from the clock signal by the known delay, and a sensor having a property that varies in response to a magnetic field at the sensor. A sampling circuit connected to the sensor and to the pulse generator is configured to measure the property of the sensor at times corresponding to pulses of the series of pulses, and to produce a sampling signal having, for each pulse, a first value (e. g. , a logical one) when the property of the sensor indicates that the magnetic field at the sensor exceeds a threshold amount and a second value (e. g. , a logical zero) when the property of the sensor indicates that the magnetic field at the sensor does not exceed the threshold amount.