Wayne J Lee

US Patent:

20200034759, Jan 30, 2020

Filed:

Jul 22, 2019

Appl. No.:

16/518868

Inventors:

- San Francisco CA, US
Wayne Tai Lee - New York NY, US
Pramithus Khadka - Ofallon MO, US
Alex Raymond Kreig - Chicago IL, US
Michael Peter Marlow - Mason City IA, US
Michael Joseph Lyons - Chicago IL, US
Dariusz Andrzej Blasiak - Park Ridge IL, US
Seth Robert Smoot - Greensburg IN, US
Tavis Easton Bones - Morton IL, US
Kyle Plattner - Edwards IL, US
Gardar Johannesson - Oakland CA, US

International Classification:

G06Q 10/06
G06F 16/901
A01B 79/00
A01G 7/00

Abstract:

Systems and methods for generating agronomic yield maps from field health imagery maps are described herein. In an embodiment, an agricultural intelligence computer system receives a field health imagery map for a particular agronomic field. The system additional receives data describing a total harvested mass of a crop on the particular agronomic field. The system computes an average yield for the plurality of locations on the particular agronomic field. Using the field health imagery map, the system generates a spatial distribution of agronomic yield based, at least in part, on the average yield. The system then generates a yield map using the spatial distribution of agronomic yield.