Amy W Liu

US Patent:

D519022, Apr 18, 2006

Filed:

Sep 17, 2004

Appl. No.:

29/213502

Inventors:

Angie L. Kosasih - Rancho Santa Margarita CA, US
Yos Singtoroj - Anaheim CA, US
Amy Liu - Monterey Park CA, US

Assignee:

Newfrey LLC - Newark DE

International Classification:

1105

US Classification:

D 8352

US Patent:

D530593, Oct 24, 2006

Filed:

Sep 16, 2004

Appl. No.:

29/213376

Inventors:

Angie L. Kosasih - Rancho Santa Margarita CA, US
Amy Liu - Monterey Park CA, US
Aaron E. Hanna - Corona CA, US

Assignee:

Newfrey LLC - Newark DE

International Classification:

0806

US Classification:

D 8310

US Patent:

20190369030, Dec 5, 2019

Filed:

May 29, 2019

Appl. No.:

16/425070

Inventors:

- Austin TX, US
Jinzhong YANG - Houston TX, US
Paul WISDOM - Houston TX, US
Amy LIU - Sugar Land TX, US
Ronald ZHU - Bellaire TX, US
Steven J. FRANK - Bellaire TX, US

International Classification:

G01N 21/90
G06T 7/33
G01N 21/01
G01N 21/88

Abstract:

Apparatus and methods for evaluating the accuracy of deformable image registration (DIR) systems. Certain aspects may include a base and a support member coupled to the base, where the support member is configured to rotate about a first axis with respect to the base. Particular aspects may include a housing coupled to the support member, where the housing is configured to rotate about a second axis with respect to the support member. Specific aspects may include an insert coupled to the housing, where the insert is configured to rotate about a third axis with respect to the housing.