David L Erickson

US Patent:

7385460, Jun 10, 2008

Filed:

Nov 1, 2005

Appl. No.:

11/264980

Inventors:

Fei Wang - Pasadena CA, US
David Erickson - Ithaca NY, US
Changhuei Yang - Pasadena CA, US

Assignee:

California Institute of Technology - Pasadena CA

International Classification:

H01P 5/00

US Classification:

333108, 333208

Abstract:

A system for detecting interactions between charged targets and analytes. The system includes a fluid channel, and a waveguide associated with the fluid channel. A detection region is associated with the waveguide, and a biasing element is operatively coupled to the detection region. The biasing element is adapted to electrically bias a portion of the waveguide at the detection region, and the charged targets are electrostatically bound to the detection region when the portion of the waveguide is electrically biased. An optical detector is adapted to detect optical changes from the detection region.

US Patent:

20060291637, Dec 28, 2006

Filed:

Jun 13, 2005

Appl. No.:

11/150303

Inventors:

David Erickson - Long Beach CA, US

International Classification:

H04M 3/42

US Classification:

379202010

Abstract:

The invention provides for systems that facilitate conference calls between a host and participants which comprises conferencing bridge units operably connected to the Public Switched Telephone Network and a communications system which can transfer information to an administrative operator, where the bridge units are located in more than one location. The invention also provides for a method to use the system to create a reliable reservationless conference call service.

US Patent:

53272200, Jul 5, 1994

Filed:

Jun 26, 1992

Appl. No.:

7/905042

Inventors:

David J. Erickson - Huntington Beach CA

Assignee:

O.C.A. Applied Optics, Inc. - Garden Grove CA

International Classification:

G01B 902

US Classification:

356355

Abstract:

An apparatus and method for testing variations in thicknesses of an optical part comprising an interferometer having a monochromatic light source (laser) which focuses a probe beam into the optical part being tested and detects a standing fringe pattern (Newton Fringes) arising through the interaction of two wavefronts produced by the reflection off the front and back surfaces of the optical part. These fringes may be circular or parallel depending upon the optical power of the probe beam. By observing the expansion and contractions of the interference rings, variations in the thickness of the part can be determined. By counting the number of interference peaks produced at the center of the fringe pattern, during relative movement between the optical part and the beam, a direct measurement of the optical part's thickness variations can be made. The direction of the thickness change is monitored by observing the slope of the intensity variation at the first ring of the interference pattern. A complete mapping of the variations in thickness of the part can be generated.