Deepak K Singh

US Patent:

7560945, Jul 14, 2009

Filed:

Feb 6, 2007

Appl. No.:

11/671599

Inventors:

Deepak K. Singh - Apex NC, US

Assignee:

International Business Machines Corporation - Armonk NY

International Classification:

G01R 31/02
G01R 31/14

US Classification:

324763, 702118

Abstract:

An integrated circuit having a frequency generator connected to a constant reference voltage source located on the integrated circuit and a monitor connected to monitor the frequency signal and from the frequency history predicting that an integrated circuit failure will occur. An adaptive power supply is disclosed that includes a frequency generator connected to a bandgap voltage source and is monitored for changes in the frequency generator output. From this change a prediction is made as to that a failure condition will occur.

US Patent:

7714635, May 11, 2010

Filed:

Feb 6, 2007

Appl. No.:

11/671531

Inventors:

Deepak K. Singh - Apex NC, US
Francois Ibrahim Atallah - Raleigh NC, US
David John Seman - Apex NC, US

Assignee:

International Business Machines Corporation - Armonk NY

International Classification:

G05F 1/10

US Classification:

327535, 327538, 327540

Abstract:

Measurement circuit components are included in an integrated circuit fabricated on a semiconductor substrate. These measurement circuits include registers that are connected to a voltage regulation circuit that provides the integrated circuit voltage source and to a power management circuit. These measurement circuits provide signals to control the voltage regulation circuit for adjusting the voltage output to the integrated circuit based upon a measurement values obtained on the semiconductor device. These measurements include temperature, IR drop at locations on the semiconductor substrate, along with the frequency response of integrated circuit.

US Patent:

7779235, Aug 17, 2010

Filed:

Feb 6, 2007

Appl. No.:

11/671627

Inventors:

Deepak K. Singh - Apex NC, US
Francois Ibrahim Atallah - Raleigh NC, US

Assignee:

International Business Machines Corporation - Armonk NY

International Classification:

G06F 9/30
G06F 1/00

US Classification:

712214, 713300

Abstract:

A method for dispatching instructions in the data processing system, having in memory for storing instructions and a plurality of central processing units, where each central processing unit includes a circuit to provide data indicating internal performance, the method having steps of receiving internal performance data signals from a pool of central processing units, selecting a central processing unit according to the received internal performance data and dispatching instructions from the memory to the selected central processing unit.

US Patent:

7797131, Sep 14, 2010

Filed:

Aug 24, 2007

Appl. No.:

11/844393

Inventors:

Deepak K. Singh - Apex NC, US
Francois Ibrahim Atallah - Raleigh NC, US
David John Seman - Apex NC, US

Assignee:

International Business Machines Corporation - Armonk NY

International Classification:

G06F 19/00
G06F 17/40

US Classification:

702182, 702187, 713500

Abstract:

A method and circuit are provided for measuring frequency response performance of an integrated circuit by providing a pulse having a rising edge and a falling edge where the pulse is provided to a plurality of serially connected components. The number of these components which have propagated the leading edge of the pulse before the occurrence of the falling edge provide a numeric indication of the circuit's frequency response and performance.

US Patent:

7865750, Jan 4, 2011

Filed:

Feb 6, 2007

Appl. No.:

11/671555

Inventors:

Deepak K. Singh - Apex NC, US
Francois Ibrahim Atallah - Raleigh NC, US
David Howard Allen - Rochester MN, US

Assignee:

International Business Machines Corporation - Armonk NY

International Classification:

G06F 1/00

US Classification:

713322, 700300

Abstract:

Measurement circuit components are included in an integrated circuit fabricated on a semiconductor substrate. A method is provided for controlling the speed of a cooling fan provided to cool an integrated circuit in which includes the steps of receiving a voltage from a thermal diode, addressing a table of digital temperatures by incrementing the address of the table entries every clock cycle of a circuit clock, converting the addressed data to a second voltage representing temperature, comparing the first voltage to the second voltage, providing a resulting temperature when both the first and second voltages are equal, and adjusting the fan speed accordingly.

US Patent:

7895454, Feb 22, 2011

Filed:

Feb 6, 2007

Appl. No.:

11/671579

Inventors:

Deepak K. Singh - Apex NC, US

Assignee:

International Business Machines Corporation - Armonk NY

International Classification:

G06F 1/26
G06F 1/32

US Classification:

713300, 713320, 713330, 718102, 718105, 718107

Abstract:

A method for compensating for dynamic IR (voltage) drop for instruction execution. In a data processing system having a memory, and a central processing unit (CPU), where the CPU includes an adaptive power supply, a method is provided for determining the power required for instruction execution, adjusting power supplied by the adaptive power supply to the CPU to execute the instruction, and dispatching the instruction from the memory to the CPU for execution.

US Patent:

7936153, May 3, 2011

Filed:

Feb 6, 2007

Appl. No.:

11/671485

Inventors:

Deepak K. Singh - Apex NC, US
Francois Ibrahim Atallah - Raleigh NC, US

Assignee:

International Business Machines Corporation - Armonk NY

International Classification:

G06F 1/26
G06F 1/32

US Classification:

323234, 713300, 713320, 713322, 713330, 327158, 327512, 327513

Abstract:

Measurement circuit components are included in an integrated circuit fabricated on a semiconductor substrate. These measurement circuits are connected to a voltage regulation circuit that provides the integrated circuit voltage source. These measurement circuits provide signals to control the voltage regulation circuit to adjust the voltage output to the integrated circuit based upon a measurement values obtained on the semiconductor device. These measurements include temperature and IR drop at locations on the semiconductor substrate, along with the frequency response of integrated circuit.

US Patent:

7971035, Jun 28, 2011

Filed:

Feb 6, 2007

Appl. No.:

11/671640

Inventors:

Deepak K. Singh - Apex NC, US
Francois Ibrahim Atallah - Raleigh NC, US

Assignee:

International Business Machines Corporation - Armonk NY

International Classification:

G06F 9/30
G06F 9/40
G06F 7/38
G06F 9/00
G06F 9/44

US Classification:

712220, 712214

Abstract:

A data processing system having a memory for storing instructions and several central processing units for executing instructions, each central processing unit includes an adaptive power supply which provides, among other data, temperature information. Circuitry is provided that receives the temperature information from the many central processing units, selects a central processing unit which has the lowest temperature and which is available to execute instructions and dispatches instructions to the selected central processing from the memory.