Dick Isabel H Liu

US Patent:

8352887, Jan 8, 2013

Filed:

Dec 3, 2010

Appl. No.:

12/960086

Inventors:

Zuo Dai - Ontario, CA
Dick Liu - Saratoga CA, US
Ming Su - Nepean, CA

Assignee:

Synopsys, Inc. - Mountain View CA

International Classification:

G06F 17/50
G06F 9/455

US Classification:

716 52, 716 53, 716112

Abstract:

Roughly described, a design rule data set is developed offline from the design rules of a target fabrication process. A design rule checking method involves traversing the corners of shapes in a layout region, and for each corner, populating a layout topology database with values that depend on respective corner locations. After the layout topology database is populated, the values are compared to values in the design rule data set to detect any design rule violations. Violations can be reported in real time, while the user is manually editing the layout. Preferably corner traversal is performed using scan lines oriented perpendicularly to edge orientations, and scanning in the direction of the edge orientations. Scans stop only at corner positions and populate the layout topology database with what information can be gleaned based on the current scan line. The different scans need not reach each corner simultaneously.

US Patent:

8448097, May 21, 2013

Filed:

Aug 16, 2011

Appl. No.:

13/211211

Inventors:

Zuo Dai - Ottawa, CA
Dick Liu - Saratoga CA, US
Ming Su - Nepean, CA

Assignee:

Synopsys, Inc. - Mountain View CA

International Classification:

G06F 17/50
G06F 9/455

US Classification:

716 52, 716 53, 716112

Abstract:

Roughly described, a design rule data set includes rules on derived layers. The rules are checked by traversing the corners of physical shapes, and for each corner, populating a layout topology database with values gleaned from that corner location, including values involving derived layers. After the layout topology database is populated, the values are compared to values in the design rule data set to detect any design rule violations, including violations of design rules defined on derived layers. Violations are reported in real time during manual editing of the layout. Preferably corner traversal is performed using scan lines oriented perpendicularly to edge orientations, scanning in the direction of the edge orientations. Scans stop only at corner positions on physical layers, and populate the layout topology database with what information can be gleaned based on the current scan line, including information about derived layers. The scans need not reach corners simultaneously.

US Patent:

20020055914, May 9, 2002

Filed:

Mar 1, 2001

Appl. No.:

09/798055

Inventors:

Dick Liu - Saratoga CA, US
Jane Hsu - Palo Alto CA, US
Raymond Chong - Cupertino CA, US
Mark Chilcott - Fremont CA, US

International Classification:

G06F017/00

US Classification:

706/050000

Abstract:

A system and method for distributed knowledge management. In one embodiment, the system includes a hosted application through which an entity administers a knowledge base (KB). An entity can be, for example, a manufacturer or a reseller of any kind. Administering a KB includes receiving a request for a knowledge item from a user of the system. A user can be an entity or a customer of an entity. Administering further includes responding to the request, which involves accessing knowledge items in at least one of multiple KBs that may be administered by multiple entities. Administering further includes publishing the request, which includes making the request and a response to the request selectively available to different users of the system based upon different levels of privilege assigned to each of the users of the system.

US Patent:

20130074024, Mar 21, 2013

Filed:

Nov 13, 2012

Appl. No.:

13/675970

Inventors:

Scott I. Chase - Pleasanton CA, US
Zuo Dai - Ottawa, CA
Dick Liu - Saratoga CA, US
Ming Su - Nepean, CA

International Classification:

G06F 17/50

US Classification:

716112

Abstract:

Roughly described, a system enables quick and accurate depiction to a user of multi-patterning layout violations so that they may be corrected manually and in real time, and without interfering with normal manual editing process. In one embodiment, the system involves iteratively building tree structures with nodes identifying islands and arcs identifying multi-patterning spacing violations between the connected islands. The system detects coloring violations during the building of these tree structures, using the relationships previously inserted. The coloring violations preferably are reported to a user in the form of visual indications of the cycles among the candidate spacing violations, with the candidate spacing violations also themselves indicated visually and individually. The user can see intuitively how to move the islands around, and in which directions and by what distance, in order to remove a multi-patterning spacing violation and thereby break the cycle.

US Patent:

20130132919, May 23, 2013

Filed:

Dec 19, 2012

Appl. No.:

13/719872

Inventors:

ZUO DAI - ONTARIO, CA
DICK LIU - SARATOGA CA, US
MING SU - NEPEAN, CA

Assignee:

SYNOPSYS, INC. - MOUNTAIN VIEW CA

International Classification:

G06F 17/50

US Classification:

716112

Abstract:

Roughly described, a design rule data set is developed offline from the design rules of a target fabrication process. A design rule checking method involves traversing the corners of shapes in a layout region, and for each corner, populating a layout topology database with values that depend on respective corner locations. After the layout topology database is populated, the values are compared to values in the design rule data set to detect any design rule violations. Violations can be reported in real time, while the user is manually editing the layout. Preferably corner traversal is performed using scan lines oriented perpendicularly to edge orientations, and scanning in the direction of the edge orientations. Scans stop only at corner positions and populate the layout topology database with what information can be gleaned based on the current scan line. The different scans need not reach each corner simultaneously.

US Patent:

20130159949, Jun 20, 2013

Filed:

Dec 18, 2012

Appl. No.:

13/718527

Inventors:

Zuo DAI - Ontario, CA
Dick LIU - Saratoga CA, US
Ming SU - Nepean, CA

Assignee:

SYNOPSYS, INC. - Mountain View CA

International Classification:

G06F 17/50

US Classification:

716112

Abstract:

Roughly described, a design rule data set is developed offline from the design rules of a target fabrication process. A design rule checking method involves traversing the corners of shapes in a layout region, and for each corner, populating a layout topology database with values that depend on respective corner locations. After the layout topology database is populated, the values are compared to values in the design rule data set to detect any design rule violations. Violations can be reported in real time, while the user is manually editing the layout. Preferably corner traversal is performed using scan lines oriented perpendicularly to edge orientations, and scanning in the direction of the edge orientations. Scans stop only at corner positions and populate the layout topology database with what information can be gleaned based on the current scan line. The different scans need not reach each corner simultaneously.

US Patent:

20130275938, Oct 17, 2013

Filed:

May 16, 2013

Appl. No.:

13/895994

Inventors:

Randy Bishop - Pleasanton CA, US
Zuo Dai - Ottowa, CA
John Hapli - Greely, CA
Dick Liu - Saratoga CA, US
Ming Su - Nepean, CA

International Classification:

G06F 17/50

US Classification:

716139

Abstract:

Roughly described, while manually dragging shapes during IC layout editing, editing operations determine which edges of which shapes are moving at what speed ratios. Based on the edge information and the DRC rules, the system calculates and keeps track of the minimum of the maximum distance the edges are allowed to move with the cursor without violating DRC rules, in four linear directions and all corner directions. Once a next cursor destination point is known, a DRC clean destination point is calculated based on the linear and corner bounds. If the next cursor position is beyond a the push-through distance ahead of the new DRC clean point, the editing objects are moved to the user's destination point. Otherwise, the editing objects are moved to the new DRC clean destination point, thereby stopping movement at that point.

US Patent:

20130298096, Nov 7, 2013

Filed:

May 24, 2013

Appl. No.:

13/902390

Inventors:

Randy Bishop - Pleasanton CA, US
Zuo Dai - Ottowa, CA
John Hapli - Greely, CA
Dick Liu - Saratoga CA, US
Ming Su - Nepean, CA

International Classification:

G06F 17/50

US Classification:

716112

Abstract:

Roughly described, while manually dragging shapes during IC layout editing, editing operations determine which edges of which shapes are moving at what speed ratios. Based on the edge information and the DRC rules, the system calculates and keeps track of the minimum of the maximum distance the edges are allowed to move with the cursor without violating DRC rules, in four linear directions and all corner directions. Once a next cursor destination point is known, a DRC clean destination point is calculated based on the linear and corner bounds. If the next cursor position is beyond a the push-through distance ahead of the new DRC clean point, the editing objects are moved to the user's destination point. Otherwise, the editing objects are moved to the new DRC clean destination point, thereby stopping movement at that point.