Douglas Patrick Wells

US Patent:

7718962, May 18, 2010

Filed:

May 29, 2007

Appl. No.:

11/807568

Inventors:

Alan W. Hunt - Pocatello ID, US
J. Frank Harmon - Pocatello ID, US
Douglas P. Wells - Pocatello ID, US

Assignee:

Idaho State University and the Board of Educa - Pocatello ID

International Classification:

G21K 7/00

US Classification:

250308, 250306, 250309, 25036301, 25036303, 25036304, 376156, 376157, 850 63

Abstract:

The present invention is directed to a defect imaging device that has an energy beam that is directed at a device under test. The energy beam creates positrons deep within the material of the device under test. When the positrons combine with electrons in the material they produce a pair of annihilation photons. The annihilation photons are detected. The Doppler broadening of the annihilation photons is used to determine if a defect is present in the material. Three dimensional images of the device under test are created by directing the energy beam at different portions of the device under test.

US Patent:

20100285559, Nov 11, 2010

Filed:

Sep 25, 2008

Appl. No.:

12/679937

Inventors:

Shiladitya DasSarma - Ellicott City MD, US
Linda Deveaux - Pocatello ID, US
Douglas P. Wells - Pocatello ID, US

International Classification:

C12N 13/00
C12N 1/21
A62D 3/02

US Classification:

4351739, 4352523, 4352625

Abstract:

The present invention relates to variants of the model halophile sp. NRC-1 that have been exposed to cycles of irradiation with high doses of 18-20 MeV electrons. These novel isolated exhibit increased resistance to radiation and may be used for bioremediation of toxic and highly radioactive waste sites and/or for studying and modulating the mechanism involved in such resistance.

US Patent:

20120281799, Nov 8, 2012

Filed:

May 4, 2011

Appl. No.:

13/100324

Inventors:

Douglas P. Wells - Pocatello ID, US
Frank Harmon - Pocatello ID, US

International Classification:

G21G 1/12
G21G 1/10

US Classification:

376157, 376190

Abstract:

Using the device and method of the present invention, high energy photons, or gamma radiation, impinge upon a target comprising a nanomaterial that includes a target isotope, resulting in the release of one or more neutrons from the target isotope. This neutron release creates an effect known as “kinematic recoil,” which results in a recoiling photo-produced radioisotope which is ejected from the nanomaterial and can be harvested in high specific activity.

US Patent:

20140205062, Jul 24, 2014

Filed:

Jan 18, 2013

Appl. No.:

13/745384

Inventors:

Alan W. Hunt - Pocatello ID, US
J. Frank Hermon - Pocatello ID, US
Douglas P. Wells - Rapid City SD, US

International Classification:

G01N 23/223

US Classification:

378 44, 250309

Abstract:

The invention is directed to a defect imaging device that has an energy beam that is directed at a device under test. The energy beam creates positrons deep within the material of the device under test. When the positrons combine with electrons in the material they produce a pair of annihilation photons. The annihilation photons are detected. The Doppler broadening of the annihilation photons is used to determine if a defect is present in the material. Three dimensional images of the device under test are created by directing the energy beam at different portions of the device under test.