Gang Liu - Sunnyvale CA, US Joseph C. Buxton - Palo Alto CA, US
Assignee:
Analog Devices, Inc. - Norwood MA
International Classification:
G05F 1/40
US Classification:
323286, 323280, 323284, 323303
Abstract:
A voltage regulator includes a linear mode regulator having a high pass filter circuit connected between its output and an output node, and a switch mode regulator having an low pass filter circuit connected between its output and the same output node. The high pass filter passes high frequency AC current provided by the linear mode regulator to the output node and reduces the low frequency AC and DC currents to substantially zero, and the low pass filter prevents the high frequency AC current produced by the linear mode regulator from being drawn by the switch mode regulator and passes the low AC and DC currents provided by the switch mode regulator to the output node. Thus, the present regulator offers the high response speed and low noise of a linear mode regulator, and the high power efficiency and large continuous output current capability of a switch mode regulator.
Method And Apparatus For Automatic Measurement Of Pad Geometry And Inspection Thereof
Gang Liu - Framingham MA, US Aaron Wallack - Natick MA, US David Michael - Wayland MA, US
Assignee:
Cognex Technology and Investment Corporation - Mt. View CA
International Classification:
G06K 9/00
US Classification:
382145, 382151, 382168
Abstract:
An image of a semiconductor interconnection pad is analyzed to determine a geometric description of the zone regions of a multiple zone semiconductor interconnection pad. Edge detection machine vision tools are used to extract features in the image. The extracted features are analyzed to derive geometric descriptions of the zone regions of the pad, that are applied in semiconductor device inspection, fabrication, and assembly operations.
Pcb Trace Coupling System For Providing High Voltage Isolation
A printed circuit board trace coupling system for providing high voltage isolation includes a driving circuit, a coupling transformer including a printed circuit board trace, and a receiving circuit.
Michael D. Shultz - Stow MA, US Christine Hiu-Tung Chen - Waltham MA, US Young Shin Cho - Cambridge MA, US Lei Jiang - Waltham MA, US Jianmei Fan - Newton MA, US Gang Liu - Waltham MA, US Dyuti Majumdar - Cambridge MA, US Jianke Li - Cambridge MA, US
Assignee:
Novartis AG - Basel
International Classification:
A61K 31/4162 A61K 31/4155 C07D 487/04 C07D 231/10
US Classification:
514403, 514406, 5483601, 5483641
Abstract:
The present teachings relate to compounds of Formula I:The present teachings also provide methods of preparing compounds of Formula I and methods of using compounds of Formula I in treating, inhibiting, or preventing pathologic conditions or disorders mediated wholly or in part by deacetylases.
Rf-Agc Scheme Insensitive To Channel Interference And Deep Fading
Songping Wu - Sunnyvale CA, US Hua Qian - Fremont CA, US Gang Liu - Fremont CA, US King Chun Tsai - San Jose CA, US Lawrence Tse - Fremont CA, US Hui-Ling Lou - Sunnyvale CA, US
Assignee:
Marvell International Ltd. - Hamilton
International Classification:
H04B 7/00
US Classification:
4552341, 455254
Abstract:
In a method and system for controlling gain in an RF receiver, an RF signal is analyzed over different attack and decay windows, from which the receiver determines (1) if the signal is in an attack condition with dip values below a threshold level thus indicating a need for increasing signal gain, or (2) if the signal is in a decay condition with threshold values above a threshold level thus indicating a need for decreasing signal gain. The receiver applies attack and decay windows of different sizes and in an asynchronous manner to create a gain control scheme that is insensitive to transient effects such as channel interference and deep fading that affect the intensities of an in-band signal.
Machine Vision Technique For Manufacturing Semiconductor Wafers
John W. Schwab - Framingham MA, US Gang Liu - Natick MA, US David J. Michael - Wayland MA, US
Assignee:
Cognex Corporation - Natick MA
International Classification:
G01B 11/14
US Classification:
356614
Abstract:
A vision system is provided to determine a positional relationship between a photovoltaic device wafer on a platen and a printing element, such as a printing screen, on a remote side of the photovoltaic device wafer from the platen. A source emits ultraviolet light along a path that is transverse to a longitudinal axis of an aperture through the platen, and a diffuser panel is located along that path. A reflector directs the light from the diffuser panel toward the aperture. A video camera is located along the longitudinal axis of the aperture and produces an image using light received from the platen aperture, wherein some of that received light was reflected by the wafer. A band-pass filter is placed in front of the camera to block ambient light. The use of diffused ultraviolet light enhances contrast in the image between the wafer and the printing element.
Metallic Nanostructures Adapted For Electromagnetic Field Enhancement
Luke P. Lee - Orinda CA, US Yu Lu - Riverside CA, US Gang L. Liu - Berkeley CA, US Jaeyoun Kim - Ames IA, US
Assignee:
The Regents of the University of California - Oakland CA
International Classification:
G01J 3/44
US Classification:
356301
Abstract:
The disclosure relates to metallic nanophotonic crescent structures, or “nanocrescent SERS probes,” that enhance detectable signals to facilitate molecular detections. More particularly, the nanocrescent SERS probes of the disclosure possess specialized geometries, including an edge surrounding the opening that is capable of enhancing local electromagnetic fields. Nanosystems utilizing such structures are particularly useful in the medical field for detecting rare molecular targets, biomolecular cellular imaging, and in molecular medicine.
Method And Apparatus For Semiconductor Wafer Alignment
David J. Michael - Wayland MA, US James Clark - La Honda CA, US Gang Liu - Natick MA, US
Assignee:
Cognex Corporation - Natick MA
International Classification:
G06K 9/00 H01L 21/677
US Classification:
414217
Abstract:
The invention provides, in some aspects, a wafer alignment system comprising an image acquisition device, an illumination source, a rotatable wafer platform, and an image processor that includes functionality for mapping coordinates in an image of an article (such as a wafer) on the platform to a “world” frame of reference at each of a plurality of angles of rotation of the platform.
Name / Title
Company / Classification
Phones & Addresses
Gang Liu
Amazing International Travel Co Travel Agencies
6462 Victoria Dr, Vancouver, BC V5P3X7 6043239128
Gang Liu President
ANALOG TECHNOLOGIES, INC. WHICH WILL DO BUSINESS IN CALIFORNIA AS DELAWARE ANALOG TECHNOLOGIES, INC
2352 Walsh Ave, Santa Clara, CA 95051 550 E Weddell Dr, Sunnyvale, CA 94089
Gang Liu Owner, President
Analog Technologies Entertainment · Engineering Services · Electronic Equipment & Supplie
550 E Weddell Dr, Sunnyvale, CA 94089 2352 Walsh Ave, Santa Clara, CA 95051 4087479760, 4087489100
Gang Liu President
Technologies Analog Other Electronic Parts Merchant Whols
Northeastern University 2013 - 2015
Masters, Computer Science
Silicon Valley University 2011 - 2012
Bachelors, Computer Science
Skills:
Java Html Management Javascript Sql C C# Microsoft Office Css Teamwork Jquery Uml Mysql Ajax Selenium Selenium Webdriver Selenium Testing Github Gitlab Oracle Database Oracle Sql Developer Jira Servicenow Aws Asp.net Web Api Jenkins Dock Cascading Style Sheets
Interests:
Science and Technology Social Services Environment Health
Lam Research
Process Engineer
University of Southern California Jul 2012 - Jul 2014
Post-Doc Scholar
Ucla Apr 2010 - Apr 2012
Post-Doc Scholar
University of California, Riverside 2004 - 2010
Graduate Student Researcher
Education:
University of California, Riverside 2004 - 2010
Doctorates, Doctor of Philosophy, Physics
Nanjing University 2000 - 2004
Bachelors, Bachelor of Science, Physics
Skills:
Nano Fabrication Nano Characterization Nanofabrication Afm Photolithography Semiconductors Thin Films Sem Carbon Nanotubes Characterization Scanning Electron Microscopy Powder X Ray Diffraction Materials Science Cvd Etching Labview