Gang Yanchun Liu

US Patent:

7171036, Jan 30, 2007

Filed:

Mar 14, 2003

Appl. No.:

10/389475

Inventors:

Gang Liu - Framingham MA, US
Aaron Wallack - Natick MA, US
David Michael - Wayland MA, US

Assignee:

Cognex Technology and Investment Corporation - Mt. View CA

International Classification:

G06K 9/00

US Classification:

382145, 382151, 382168

Abstract:

An image of a semiconductor interconnection pad is analyzed to determine a geometric description of the zone regions of a multiple zone semiconductor interconnection pad. Edge detection machine vision tools are used to extract features in the image. The extracted features are analyzed to derive geometric descriptions of the zone regions of the pad, that are applied in semiconductor device inspection, fabrication, and assembly operations.

US Patent:

7943652, May 17, 2011

Filed:

Mar 26, 2009

Appl. No.:

12/411715

Inventors:

Michael D. Shultz - Stow MA, US
Christine Hiu-Tung Chen - Waltham MA, US
Young Shin Cho - Cambridge MA, US
Lei Jiang - Waltham MA, US
Jianmei Fan - Newton MA, US
Gang Liu - Waltham MA, US
Dyuti Majumdar - Cambridge MA, US
Jianke Li - Cambridge MA, US

Assignee:

Novartis AG - Basel

International Classification:

A61K 31/4162
A61K 31/4155
C07D 487/04
C07D 231/10

US Classification:

514403, 514406, 5483601, 5483641

Abstract:

The present teachings relate to compounds of Formula I:The present teachings also provide methods of preparing compounds of Formula I and methods of using compounds of Formula I in treating, inhibiting, or preventing pathologic conditions or disorders mediated wholly or in part by deacetylases.

US Patent:

8139231, Mar 20, 2012

Filed:

May 1, 2008

Appl. No.:

12/113492

Inventors:

John W. Schwab - Framingham MA, US
Gang Liu - Natick MA, US
David J. Michael - Wayland MA, US

Assignee:

Cognex Corporation - Natick MA

International Classification:

G01B 11/14

US Classification:

356614

Abstract:

A vision system is provided to determine a positional relationship between a photovoltaic device wafer on a platen and a printing element, such as a printing screen, on a remote side of the photovoltaic device wafer from the platen. A source emits ultraviolet light along a path that is transverse to a longitudinal axis of an aperture through the platen, and a diffuser panel is located along that path. A reflector directs the light from the diffuser panel toward the aperture. A video camera is located along the longitudinal axis of the aperture and produces an image using light received from the platen aperture, wherein some of that received light was reflected by the wafer. A band-pass filter is placed in front of the camera to block ambient light. The use of diffused ultraviolet light enhances contrast in the image between the wafer and the printing element.

US Patent:

8149397, Apr 3, 2012

Filed:

Mar 14, 2006

Appl. No.:

11/886390

Inventors:

Luke P. Lee - Orinda CA, US
Yu Lu - Riverside CA, US
Gang L. Liu - Berkeley CA, US
Jaeyoun Kim - Ames IA, US

Assignee:

The Regents of the University of California - Oakland CA

International Classification:

G01J 3/44

US Classification:

356301

Abstract:

The disclosure relates to metallic nanophotonic crescent structures, or “nanocrescent SERS probes,” that enhance detectable signals to facilitate molecular detections. More particularly, the nanocrescent SERS probes of the disclosure possess specialized geometries, including an edge surrounding the opening that is capable of enhancing local electromagnetic fields. Nanosystems utilizing such structures are particularly useful in the medical field for detecting rare molecular targets, biomolecular cellular imaging, and in molecular medicine.

US Patent:

8162584, Apr 24, 2012

Filed:

Aug 23, 2006

Appl. No.:

11/508551

Inventors:

David J. Michael - Wayland MA, US
James Clark - La Honda CA, US
Gang Liu - Natick MA, US

Assignee:

Cognex Corporation - Natick MA

International Classification:

G06K 9/00
H01L 21/677

US Classification:

414217

Abstract:

The invention provides, in some aspects, a wafer alignment system comprising an image acquisition device, an illumination source, a rotatable wafer platform, and an image processor that includes functionality for mapping coordinates in an image of an article (such as a wafer) on the platform to a “world” frame of reference at each of a plurality of angles of rotation of the platform.

US Patent:

8189194, May 29, 2012

Filed:

Sep 12, 2008

Appl. No.:

12/209248

Inventors:

John W. Schwab - Framingham MA, US
Gang Liu - Natick MA, US
David J. Michael - Wayland MA, US
Lei Wang - Shrewsbury MA, US

Assignee:

Cognex Corporation - Natick MA

International Classification:

G01B 11/00

US Classification:

356399, 356401, 3562372, 3562375

Abstract:

A vision system is provided to determine a positional relationship between a semiconductor wafer on a platen and an element on a processing machine, such as a printing screen, on a remote side of the semiconductor wafer from the platen. A source directs ultraviolet light through an aperture in the platen to illuminate the semiconductor wafer and cast a shadow onto the element adjacent an edge of the semiconductor wafer. A video camera produces an image using light received from the platen aperture, wherein some of that received light was reflected by the wafer. The edge of the semiconductor wafer in the image is well defined by a dark/light transition.

US Patent:

8349883, Jan 8, 2013

Filed:

Apr 8, 2011

Appl. No.:

13/082956

Inventors:

Michael D. Shultz - Cambridge MA, US
Christine Hiu-Tung Chen - Cambridge MA, US
Young Shin Cho - Cambridge MA, US
Lei Jiang - Cambridge MA, US
Jianmei Fan - Cambridge MA, US
Gang Liu - Cambridge MA, US
Dyuti Majumdar - Cambridge MA, US
Jianke Li - Cambridge MA, US

Assignee:

Novartis AG - Basel

International Classification:

A61K 31/4162
A61K 31/4155

US Classification:

514403, 514406

Abstract:

The present teachings relate to compounds of Formula I:The present teachings also provide methods of preparing compounds of Formula I and methods of using compounds of Formula I in treating, inhibiting, or preventing pathologic conditions or disorders mediated wholly or in part by deacetylases.

US Patent:

8361932, Jan 29, 2013

Filed:

May 2, 2007

Appl. No.:

12/299284

Inventors:

Gang L. Liu - Berkeley CA, US
Jonathan A. Ellman - Oakland CA, US
Luke P. Lee - Orinda CA, US
Fanqing Frank Chen - Moraga CA, US

Assignee:

The Regents of the University of California - Oakland CA

International Classification:

C40B 30/04
C40B 40/10
G01N 33/573

US Classification:

506 9, 435 74, 506 18

Abstract:

This invention pertains to the in vitro detection of proteases using a single peptide-conjugate nanocrescent surface enhanced Raman scattering (SERS) probes with at least nanomolar sensitivity. The probe enables detection of proteolytic activity in extremely small volume and at low concentration. In certain embodiments the probes comprise an indicator for the detection of an active protease, where the indicator comprises a nanocrescent attached to a peptide, where said peptide comprises a recognition site for the protease and a Raman tag attached to the peptide.